Gastroduodenal bleeding in patients with acute cerebrovascular accident von Korolev, M. P., Spesivtsev, Yu. A., Fedotov, L. E., Klimov, A. V., Terekhov, I. S., Kondratyev, A. N., Doniyarov, Sh. Kh

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COMPLICATIONS AFTER CARDIAC INJURIES von M. P. Korolyov, R. S. Sagatinov, Sh. K. Urakcheev, N. K. Pastukhova, Yu. A. Spesivtsev, E. S. Mezentseva

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Thermocapillary deformations of a spot-heated self-rewetting liquid layer von Lyulin, Yu V, Spesivtsev, S E, Marchuk, I V, Kabov, O A

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Thickness measurement in a horizontal liquid layer when heated from a localized hot-spot von Spesivtsev, S E, Lyulin, Yu V, Marchuk, I V, Kabov, O A

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Study of dynamics of thin liquid layer breakdown under conditions of spot heating and formation of a droplet cluster von Lyulin, Yu. V., Spesivtsev, S. E., Marchuk, I. V., Kabov, O. A.

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Evaluation of the Dynamics of Phytomass in the Tundra Zone Using a Fuzzy-Opportunity Approach von Mikhailov, V. V., Spesivtsev, Alexandr V., Perevaryukha, Andrey Yu

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Investigation of disruption dynamics of the horizontal liquid layer with spot heating from the substrate side von Lyulin, Yu. V., Spesivtsev, S. E., Marchuk, I. V., Kabov, O. A.

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Contactless transfer of image via the gas phase in a thermoactivated process von Shevtsov, Yu. V., Kuchumov, B. M., Kruchinin, V. N., Spesivtsev, E. V., Golovnev, I. F., Igumenov, I. K.

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In situ ellipsometry for control of Hg1−xCdxTe nanolayer structures and inhomogeneous layers during MBE growth von Shvets, V.A., Rykhlitski, S.V., Spesivtsev, E.V., Aulchenko, N.A., Mikhailov, N.N., Dvoretsky, S.A., Sidorov, Yu.G., Smirnov, R.N.

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Monitoring the composition of the [Cd.sub.1-z][Zn.sub.z]Te heteroepitaxial layers by spectroscopic ellipsometry von Yakushev, M.V, Shvets, V.A, Azarov, I.A, Rykhlytski, S.V, Sidorov, Yu. G, Spesivtsev, E.V, Shamirzaev, T.S

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Conductance oscillations near bonded interface in the ultra thin silicon-on-insulator layers at room temperature von Naumova, O.V., Antonova, I.V., Popov, V.P., Sapognikova, N.V., Nastaushev, Yu.V., Spesivtsev, E.V., Aseev, A.L.

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Monitoring the composition of the Cd1 − zZnzTe heteroepitaxial layers by spectroscopic ellipsometry von Yakushev, M. V., Shvets, V. A., Azarov, I. A., Rykhlytski, S. V., Sidorov, Yu. G., Spesivtsev, E. V., Shamirzaev, T. S.

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Structural characterization of iron silicide nanoclusters in Si/FeSi heterosystems using magneto-optic ellipsometry von Kosyrev, N. N., Zabluda, V. N., Varnakov, S. N., Shvets, V. A., Rykhlitsky, S. V., Spesivtsev, E. V., Prokop’ev, V. Yu

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Monitoring the composition of the Cd{sub 1-} {sub z}Zn{sub z}Te heteroepitaxial layers by spectroscopic ellipsometry von Yakushev, M. V., Shvets, V. A., Azarov, I. A., Rykhlytski, S. V., Sidorov, Yu. G., Spesivtsev, E. V., Shamirzaev, T. S.

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Monitoring the composition of the Cd1 − z Zn z Te heteroepitaxial layers by spectroscopic ellipsometry von Yakushev, M. V., Shvets, V. A., Azarov, I. A., Rykhlytski, S. V., Sidorov, Yu. G., Spesivtsev, E. V., Shamirzaev, T. S.

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Integrated analytical equipment for control of film growth in MBE technology von Mikhailov, N.N., Rykhlitski, S.V., Spesivtsev, E.V., Dulin, S.A., Nazarov, N.I., Sidorov, Yu.G., Dvoretsky, S.A.

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Ellipsometry as a powerful tool for the control of epitaxial semiconductor structures in-situ and ex-situ von Svitashev, K.K., Shvets, V.A., Mardezhov, A.S., Dvoretsky, S.A., Sidorov, Yu.G., Mikhailov, N.N., Spesivtsev, E.V., Rychlitsky, S.V.

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In situ ellipsometry for control of Hg1-xCdxTe nanolayer structures and inhomogeneous layers during MBE growth von SHVETS, V. A, RYKHLITSKI, S. V, SPESIVTSEV, E. V, AULCHENKO, N. A, MIKHAILOV, N. N, DVORETSKY, S. A, SIDOROV, Yu. G, SMIRNOV, R. N

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Conductance oscillations near bonded interface in the ultra thin silicon-on-insulator layers at room temperature von NAUMOVA, O. V, ANTONOVA, I. V, POPOV, V. P, SAPOGNIKOVA, N. V, NASTAUSHEV, Yu. V, SPESIVTSEV, E. V, ASEEV, A. L

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Integrated analytical equipment for control of film growth in MBE technology von MIKHAILOV, N. N, RYKHLITSKI, S. V, SPESIVTSEV, E. V, DULIN, S. A, NAZAROV, N. I, SIDOROV, Yu. G, DVORETSKY, S. A

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