Monolithic Investigation of Hydrogen Plasma-Treated and Etched p-GaN Gate HEMTs Under OFF-State Drain Stress von Li, Fan, Liang, Ye, Zhang, Yuanlei, Huang, Yixiao, Li, Ang, Zhu, Yuhao, Yu, Chenruiyuan, Wang, Yubo, Wu, Shiqiang, Yu, Guohao, Pei, Yi, Zhang, Baoshun, Liu, Wen

Volltext