A method for detection of Alzheimer's disease using ICA-enhanced EEG measurements von Melissant, Co, Ypma, Alexander, Frietman, Edward E.E., Stam, Cornelis J.

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Online Personalization of Hearing Instruments von Ypma, Alexander, Geurts, Job, Özer, Serkan, van der Werf, Erik, de Vries, Bert

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Online Personalization of Hearing Instruments von Ypma, Alexander, Geurts, Job, Özer, Serkan, van der Werf, Erik, de Vries, Bert

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Blind separation of rotating machine sources: bilinear forms and convolutive mixtures von Ypma, Alexander, Leshem, Amir, P.W. Duin, Robert

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Novel approximations for inference in nonlinear dynamical systems using expectation propagation von Ypma, Alexander, Heskes, Tom

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Pump Failure Detection Using Support Vector Data Descriptions von Tax, David M. J., Ypma, Alexander, Duin, Robert P. W.

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Automatic Categorization of Web Pages and User Clustering with Mixtures of Hidden Markov Models von Ypma, Alexander, Heskes, Tom

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Online Noise Estimation Using Stochastic-Gain HMM for Speech Enhancement von Zhao, D.Y., Kleijn, W.B., Ypma, A., de Vries, B.

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METHOD TO LABEL SUBSTRATES BASED ON PROCESS PARAMETERS von BASTANI, Vahid, YPMA, Alexander

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Method to label substrates based on process parameters von Ypma, Alexander, Bastani, Vahid

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METHOD TO LABEL SUBSTRATES BASED ON PROCESS PARAMETERS von BASTANI, Vahid, YPMA, Alexander

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METHOD TO LABEL SUBSTRATES BASED ON PROCESS PARAMETERS von BASTANI, Vahid, YPMA, Alexander

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Introduction to the Special Section on AI in Manufacturing: Current Trends and Challenges von Lijffijt, Jefrey, Gkorou, Dimitra, Van Hertum, Pieter, Ypma, Alexander, Pechenizkiy, Mykola, Vanschoren, Joaquin

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METHOD TO LABEL SUBSTRATES BASED ON PROCESS PARAMETERS von BASTANI, Vahid, YPMA, Alexander

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SYSTEMS AND METHODS FOR PROCESS METRIC AWARE PROCESS CONTROL von LARRANAGA, Maialen, GKOROU, Dimira, YPMA, Alexander

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METHOD TO LABEL SUBSTRATES BASED ON PROCESS PARAMETERS von BASTANI, Vahid, YPMA, Alexander

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SYSTEMS AND METHODS FOR PROCESS METRIC AWARE PROCESS CONTROL von GKOROU, Dimitra, LARRANAGA, Maialen, YPMA, Alexander

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METHOD FOR LABELING TIME SERIES DATA RELATING TO ONE OR MORE MACHINES von GKOROU, Dimitra, GANTAPARA, Anjan Prasad, AYDIN, Yakup, YPMA, Alexander

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Introduction to the special section on AI in manufacturing : current trends and challenges von Lijffijt, Jefrey, Gkorou, Dimitra, Van Hertum, Pieter, Ypma, Alexander, Pechenizkiy, Mykola, Vanschoren, Joaquin

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METHOD AND APPARATUS FOR CONCEPT DRIFT MITIGATION von GONZALEZ HUESCA, Juan Manuel, LANCIA, Carlo, KOULIERAKIS, Eleftherios, YPMA, Alexander

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