Total Ionizing Dose Response of a 22-nm Compiled Fully-Depleted-Silicon-on-Insulator Static Random Access Memory von Clark, Lawrence T., Brown, William E., Holbert, Keith E., Rao, A., Bikkina, P., Turowski, Marek, Levy, Andrew, Olvarez, T., Butler, Jim D., YoungSciortino, Clifford, Guertin, Steven M.

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Measuring and Modeling Single Event Transients in 12-nm Inverters von Agarwal, Sapan, Clark, Lawrence T., Youngsciortino, Clifford, Ng, Garrick, Black, Dolores, Cannon, Matthew, Black, Jeffrey, Quinn, Heather, Brunhaver, John, Barnaby, Hugh, Manuel, Jack, Blansett, Ethan, Marinella, Matthew J.

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