Frequency selectivity of spin Hall magnetoresistance sensor and its applications in eddy current testing von Lu, Ling, Xie, Hang, Luo, Ziyan, Muthu, Natchammai, Chen, Xin, Li, Xiaomin, Hua, Younan, Wu, Yihong

Volltext

One-Step Synthesis of Metal/Semiconductor Heterostructure NbS2/MoS2 von Fu, Qundong, Wang, Xiaowei, Zhou, Jiadong, Xia, Juan, Zeng, Qingsheng, Lv, Danhui, Zhu, Chao, Wang, Xiaolei, Shen, Yue, Li, Xiaomin, Hua, Younan, Liu, Fucai, Shen, Zexiang, Jin, Chuanhong, Liu, Zheng

Volltext

Magnetic stray field mapping of stainless steel sheets using spin Hall magnetoresistance sensor von Lu, Ling, Li, Xiaomin, Hua, Younan, Wu, Yihong

Volltext

Platinum composition dependence of spin-orbit torque in (Fe0.8Mn0.2)1−xPtx single-layer ferromagnet von Luo, Ziyan, Lu, Ling, Xie, Hang, Xu, Yanjun, Chen, Xin, Talapatra, Abhishek, Adeyeye, Adekunle Olusola, Hua, Younan, Li, Xiaomin, Wu, Yihong

Volltext

17.4: Invited Paper: Characterization and Failure Analysis of OLED devices by FIB/TEM Techniques von Liu, Binghai, Tan, Andrew, Hua, Younan, Qiao, Mingshen, Li, Xiaomin

Volltext

Electron-beam radiation induced degradation of silicon nitride and its impact to semiconductor failure analysis by TEM von Liu, Binghai, Dong, Zhi Li, Hua, Younan, Fu, Chao, Li, Xiaomin, Tan, Pik Kee, Zhao, Yuzhe

Volltext

Photoluminescence and multiphonon resonant Raman scattering in low-temperature grown ZnO nanostructures von Kumar, Bhupendra, Gong, Hao, Chow, Shue Yin, Tripathy, Sudhiranjan, Hua, Younan

Volltext

Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts von Wu, Yihong, Wang, Ying, Wang, Jiayi, Zhou, Miao, Zhang, Aihua, Zhang, Chun, Yang, Yanjing, Hua, Younan, Xu, Baoxi

Volltext

Studies on Galvanic Corrosion on Floating and Grounded Bondpads in Wafer Fabrication von Hua, Younan, Ping, Lee Yuan, Rao, Nistala R., Qinghua, Tian

Volltext

Two-dimensional Chemical Delineation of Junction Profile with High Spatial Resolution and Application in Failure Analysis in 65nm Technology Node von Liu, Binghai, Hua, Younan, Mo, Zhiqiang, Adrian, Ng

Volltext

Application of deuterium oxide (D2O) isotope tracing technique for encapsulated QFN failure analysis von Lois, Liao Jinzhi, Meng, Tian, Yong, Du, Qiang, Ji, Lei, Zhu, Xi, Zhang, Younan, Hua, Xiaomin, Li

Volltext

Platinum composition dependence of spin-orbit torque in (Fe0.8Mn0.2)1− x Pt x single-layer ferromagnet von Luo, Ziyan, Lu, Ling, Xie, Hang, Xu, Yanjun, Chen, Xin, Talapatra, Abhishek, Adeyeye, Adekunle Olusola, Hua, Younan, Li, Xiaomin, Wu, Yihong

Volltext

One-Step Synthesis of Metal/Semiconductor Heterostructure NbS 2 /MoS 2 von Fu, Qundong, Wang, Xiaowei, Zhou, Jiadong, Xia, Juan, Zeng, Qingsheng, Lv, Danhui, Zhu, Chao, Wang, Xiaolei, Shen, Yue, Li, Xiaomin, Hua, Younan, Liu, Fucai, Shen, Zexiang, Jin, Chuanhong, Liu, Zheng

Volltext

Quantitative investigation of the adhesion failure of Ti-based metal thin films on Si wafers von Chen Shuting, Zhu Jie, Anyan, D., Hua Younan

Volltext

Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts von Wu, Yihong, Wang, Ying, Wang, Jiayi, Zhou, Miao, Zhang, Aihua, Zhang, Chun, Yang, Yanjing, Younan Hua, Xu, Baoxi

Volltext

Energy-Dispersive X-Ray Fluorescence Determination of Pure- Element Intensities Using the "Low-Concentration Method" von YAP, C. T., HUA, Younan

Volltext

Photoluminescence and multiphonon resonant Raman scatteringin low-temperature grown ZnO nanostructures von Kumar, Bhupendra, Gong, Hao, Chow, Shue Yin, Tripathy, Sudhiranjan, Hua, Younan

Volltext

Failure Analysis of Pitting Problem on Microchip Al Bondpads in Wafer Fabrication von Tai Eve, Hua Younan, Rao Ramesh, Zhao Siping

Volltext bestellen

Concentration Determination of Major and Minor Elements in Iron-Rich and Other Geological Samples Using X-Ray Fluorescence Analysis von HUA, Younan, YAP, C. T.

Volltext

Studies and applications of standardless EDX quantification method in failure analysis of wafer fabrication von Hua Younan, Liu Binghai, Mo Zhiqiang, Teong, J.

Volltext