White-light-induced disruption of nanoscale conducting filament in hafnia von Zhou, Y., Yew, K. S., Ang, D. S., Kawashima, T., Bera, M. K., Zhang, H. Z., Bersuker, G.

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Role of interfacial layer on complementary resistive switching in the TiN/HfOx/TiN resistive memory device von Zhang, H. Z., Ang, D. S., Gu, C. J., Yew, K. S., Wang, X. P., Lo, G. Q.

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Bimodal Weibull Distribution of Metal/High- \kappa Gate Stack TDDB-Insights by Scanning Tunneling Microscopy von Yew, K. S., Ang, D. S., Bersuker, G.

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On the area scalability of valence-change memristors for neuromorphic computing von Ang, D. S., Zhou, Y., Yew, K. S., Berco, D.

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Multideposition Multiroom-Temperature Annealing via Ultraviolet Ozone for HfZrO High- \kappa and Integration With a TiN Metal Gate in a Gate-Last Process von Ling Wu, HongYu Yu, Yew, K S, Jisheng Pan, Liu, W J, Tían Li Duan

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Argon-plasma-controlled optical reset in the SiO2/Cu filamentary resistive memory stack von Kawashima, T., Yew, K. S., Zhou, Y., Ang, D. S., Zhang, H. Z., Kyuno, K.

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Enhanced stability of complementary resistance switching in the TiN/HfOx/TiN resistive random access memory device via interface engineering von Zhang, H. Z., Ang, D. S., Yew, K. S., Wang, X. P.

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Observation of Self-Reset During Forming of the TiN/HfOx/TiN Resistive Switching Device von Zhang, H. Z., Ang, D. S., Yew, K. S., Wang, X. P.

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Study of the Multistep-Deposited and UV-Ozone-Annealed HfZrO Gate Stack by Scanning Tunneling Microscopy and Pulse C- V Measurement von Yew, K. S., Ang, D. S.

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A New Method for Enhancing High- k/Metal-Gate Stack Performance and Reliability for High- k Last Integration von Yew, K. S., Ang, D. S., Tang, L. J.

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Cannulated versus Non-Cannulated Cancellous Screw Fixation for Femoral Neck Fractures: A Synthetic Bone Biomechanical Study von Gardner, AW, Toh, MZ, Yew, KSA, Lie, DTT, Chou, SM

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Surgically treated cervical myelopathy: a functional outcome comparison study between multilevel anterior cervical decompression fusion with instrumentation and posterior laminopla... von Seng, Chusheng, MBBS, MRCS (Edin), Tow, Benjamin P.B., MBBS, FRCSEd (Ortho), Siddiqui, Mashfiqul A., MBBS, MRCS, MMed (Ortho), Srivastava, Abhishek, MBBS, MS (Ortho), Wang, Lushun, MBBS, MRCS (Edin), Yew, Andy K.S., PhD, Yeo, William, BASc (Physiotherapy), Khoo, Shu Hui Rebecca, Balakrishnan, Nidu Maran Shanmugam, MSN, BHSN, Bin Abd Razak, Hamid Rahmatullah, MBBS, Chen, John L.T., MBBS, FRCSEd, Guo, Chang M., MBBS, FRCSEd, FAMS (Ortho Surg), Tan, Seang B., MBBS, FRCSEd, FAMS (Ortho Surg), Yue, Wai-Mun, MBBS, FRCSEd, FAMS (Ortho Surg)

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A technique to obtain correct rotational alignment during closed locked intramedullary nailing of the femur von Deshmukh, R.G., Lou, K.K., Neo, C.B., Yew, K.S., Rozman, I., George, J.

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Evaluation of Medial-Lateral Stability and Functional Outcome Following Total Knee Arthroplasty: Results of a Single Hospital Joint Registry von Seah, Renyi Benjamin, MRCSed, BSc, Yeo, Seng Jin, FRCSed, Chin, Pak Lin, FRCSed, Yew, Andy K.S., PhD, Chong, Hwei Chi, BSc, Lo, Ngai Nung, FRCSed

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Externalised locking compression plate as an alternative to the unilateral external fixator: a biomechanical comparative study of axial and torsional stiffness von Ang, B F H, Chen, J Y, Yew, A K S, Chua, S K, Chou, S M, Chia, S L, Koh, J S B, Howe, T S

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Gap formation after single lateral row versus dual-row suture bridge cuff repair: An ovine biomechanical model von Tan, Kelvin G., Lie, Denny TT, Yew, Andy KS, Chou, Siaw Meng

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Optical reset modulation in the SiO2/Cu conductive-bridge resistive memory stack von Kawashima, T., Zhou, Y., Yew, K. S., Ang, D. S.

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Mechanism of high-k dielectric-induced breakdown of the interfacial SiO2 layer von Bersuker, G, Heh, D, Young, C D, Morassi, L, Padovani, A, Larcher, L, Yew, K S, Ong, Y C, Ang, D S, Pey, K L, Taylor, W

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Medial migration in cephalomedullary nail fixation of pertrochanteric hip fractures: A biomechanical analysis using a novel bidirectional cyclic loading model von Law, G W, Wong, Y R, Yew, A K-S, Choh, A C T, Koh, J S B, Howe, T S

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Haptic and visual augmented reality interface for programming welding robots von Ni, D., Yew, A. W. W., Ong, S. K., Nee, A. Y. C.

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