Accurate Extraction of Effective Channel Length and Source/Drain Series Resistance in Ultrashort-Channel MOSFETs by Iteration Method von KIM, Junsoo, LEE, Jaehong, SONG, Ickhyun, YUN, Yeonam, JONG DUK LEE, PARK, Byung-Gook, SHIN, Hyungcheol

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fmax Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor von JHON, Hee-Sauk, LEE, Jae-Hong, LEE, Jaeho, OH, Byoungchan, SONG, Ickhyun, YEONAM YUN, PARK, Byung-Gook, LEE, Jong-Duk, SHIN, Hyungcheol

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f Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor von Hee-Sauk Jhon, Jae-Hong Lee, Jaeho Lee, Byoungchan Oh, Ickhyun Song, Yeonam Yun, Byung-Gook Park, Jong-Duk Lee, Hyungcheol Shin

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On the Characteristics and Spatial Dependence of Channel Thermal Noise in Nanoscale Metal–Oixde–Semiconductor Field Effect Transistors von Jeon, Jongwook, Yun, Yeonam, Kim, Junsoo, Park, Byung-Gook, Lee, Jong Duk, Shin, Hyungcheol

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A New Noise Parameter Model of Short-Channel MOSFETs von Jongwook Jeon, Ickhyun Song, In Man Kang, Yeonam Yun, Byung-Gook Park, Jong Duk Lee, Hyungcheol Shin

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Small-signal modeling of MOSFET cascode with merged diffusion von Yun, Yeonam, Jhon, Hee-Sauk, Jeon, Jongwook, Lee, Jaehong, Shin, Hyungcheol

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[Formula Omitted] Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor von Jhon, Hee-Sauk, Lee, Jae-Hong, Lee, Jaeho, Oh, Byoungchan, Song, Ickhyun, Yun, Yeonam, Park, Byung-Gook, Lee, Jong-Duk, Shin, Hyungcheol

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Multigate MOSFET in a Bulk Technology by Integrating Polysilicon-Filled Trenches von Ramadout, B., Guo-Neng Lu, Carrere, J.-P., Pinzelli, L., Perrot, C., Rivoire, M., Nemouchi, F.

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f max Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor von Jhon, Hee-Sauk, Lee, Jae-Hong, Lee, Jaeho, Oh, Byoungchan, Song, Ickhyun, Yun, Yeonam, Park, Byung-Gook, Lee, Jong-Duk, Shin, Hyungcheol

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Extraction of Effective Carrier Velocity and Observation of Velocity Overshoot in Sub-40 ㎚ MOSFETs von Junsoo Kim, Jaehong Lee, Yeonam Yun, Byung-Gook Park, Jong Duk Lee, Hyungcheol Shin

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Extraction of Effective Carrier Velocity in RF MOSFETs von Yeonam Yun, In Man Kang, Byung-Gook Park, Jong Duk Lee, Hyungcheol Shin

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Temperature dependence of effective channel length, source/drain resistance, and electron mobility in sub-50 nm MOSFETs von Kim, Junsoo, Lee, Jaehong, Yun, Yeonam, Park, Byung-Gook, Lee, Jong Duk, Shin, Hyungcheol

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