300-mm full-factory Simulations for 90- and 65-nm IC manufacturing von Pillai, D.D., Bass, E.L., Dempsey, J.C., Yellig, E.J.

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Robust deterministic scheduling in stochastic environments: The method of capacity hedge points von Yellig, E. J., Mackulak, G.T.

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Projecting on-time performance for deterministic schedules in dynamic environments von Yellig, Edward J., Mackulak, Gerald T.

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