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    An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors

    An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors von Xhafa, Xhesila, Gungordu, Ali Dogus, Erol, Didem, Yavuz, Yavuzhan, Yelten, Mustafa Berke


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