High resolution characterizations of fine structure of semiconductor device and material using scanning nonlinear dielectric microscopy von Cho, Yasuo

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Electrical conduction in nanodomains in congruent lithium tantalate single crystal von Cho, Yasuo

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Scanning nonlinear dielectric microscopy von Cho, Yasuo

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Effects of deposition conditions on the ferroelectric properties of (Al1−xScx)N thin films von Yasuoka, Shinnosuke, Shimizu, Takao, Tateyama, Akinori, Uehara, Masato, Yamada, Hiroshi, Akiyama, Morito, Hiranaga, Yoshiomi, Cho, Yasuo, Funakubo, Hiroshi

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Material Design Strategy for Enhancement of Readback Signal Intensity in Ferroelectric Probe Data Storage von Hiranaga, Yoshiomi, Cho, Yasuo

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Surface Potential Fluctuations of SiO2/SiC Interfaces Investigated by Local Capacitance-Voltage Profiling Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy von Cho, Yasuo, Yamasue, Kohei

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Nano-domains and related phenomena in congruent lithium tantalate single crystals studied by scanning nonlinear dielectric microscopy von Cho, Yasuo

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Scanning probe-type data storage beyond hard disk drive and flash memory von Cho, Yasuo, Hong, Seungbum

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Local carrier distribution imaging on few-layer MoS2 exfoliated on SiO2 by scanning nonlinear dielectric microscopy von Yamasue, Kohei, Cho, Yasuo

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Carrier distribution imaging using ∂C/∂z-mode scanning nonlinear dielectric microscopy von Hiranaga, Yoshiomi, Cho, Yasuo

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Influence of Non-Uniform Interface Defect Clustering on Field-Effect Mobility in SiC MOSFETs Investigated by Local Deep Level Transient Spectroscopy and Device Simulation von Yamagishi, Yuji, Cho, Yasuo, Yamasue, Kohei

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A scanning nonlinear dielectric microscopic investigation of potential-induced degradation in monocrystalline silicon solar cells von Cho, Yasuo, Jonai, Sachiko, Masuda, Atsushi

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Scanning nonlinear dielectric potentiometry von Yamasue, Kohei, Cho, Yasuo

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Visualization of Gate-Bias-Induced Carrier Redistribution in SiC Power DIMOSFET Using Scanning Nonlinear Dielectric Microscopy von Chinone, Norimichi, Yasuo Cho

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Nanoscale mapping to assess the asymmetry of local C–V curves obtained from ferroelectric materials von Hiranaga, Yoshiomi, Mimura, Takanori, Shimizu, Takao, Funakubo, Hiroshi, Cho, Yasuo

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High-density ferroelectric recording using a hard disk drive-type data storage system von Aoki, Tomonori, Hiranaga, Yoshiomi, Cho, Yasuo

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Boxcar Averaging Scanning Nonlinear Dielectric Microscopy von Yamasue, Kohei, Cho, Yasuo

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Charge gradient microscopy von Hong, Seungbum, Tong, Sheng, Park, Woon Ik, Hiranaga, Yoshiomi, Cho, Yasuo, Roelofs, Andreas

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Interfacial Charge States in Graphene on SiC Studied by Noncontact Scanning Nonlinear Dielectric Potentiometry von Yamasue, Kohei, Fukidome, Hirokazu, Funakubo, Kazutoshi, Suemitsu, Maki, Cho, Yasuo

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Local capacitance-voltage profiling and deep level transient spectroscopy of SiO2/SiC interfaces by scanning nonlinear dielectric microscopy von Yamasue, Kohei, Cho, Yasuo

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