Implementation of infants risk detection sensing system using IoT von Yang, Youseok, Lee, Taeo, Lee, Yechan, Choi, Jaehyeon, Park, Eunju, Lim, Hankyu

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Semiconductor having a source/drain contact with a single inner spacer von Suh, Youseok, Bao, Junjing, Yang, Haining

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SOURCE/DRAIN CONTACTS BETWEEN TRANSISTOR GATES WITH ABBREVIATED INNER SPACERS FOR IMPROVED CONTACT AREA AND RELATED METHOD OF FABRICATION von Suh, Youseok, Bao, Junjing, Yang, Haining

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SEMICONDUCTOR HAVING A SOURCE/DRAIN CONTACT WITH A SINGLE INNER SPACER von SUH, Youseok, BAO, Junjing, YANG, Haining

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SEMICONDUCTOR HAVING A SOURCE/DRAIN CONTACT WITH A SINGLE INNER SPACER von SUH, Youseok, BAO, Junjing, YANG, Haining

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단일 내부 스페이서를 구비한 소스/드레인 접점을 갖는 반도체 von YANG HAINING, SUH YOUSEOK, BAO JUNJING

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Semicondutor tendo um contato de fonte/dreno com um espaçador interno único von YANG HAINING, SUH YOUSEOK, BAO JUNJING

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Contact for semiconductor device von Choi, Jihong, Liu, Yanxiang, Suh, Youseok, Bao, Junjing, Yang, Haining

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System and method for manufacturing self-aligned STI with single poly von Fang, Shenqing, Shiraiwa, Hidehiko, Singh, Lovejeet, Thurgate, Tim, Suh, Youseok, Chang, Kuo-Tung, Matsumoto, David, Yang, Chih-Yuh, Sachar, Hapreet, Joshi, Amol Ramesh, Ding, Meng

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3-D integrated circuit system and method von Kim, Eunha, Wahl, Jeremy, Fang, Shenqing, Suh, YouSeok, Chang, Kuo-Tung, Ma, Yi, Sugino, Rinji, Yang, Jean

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Integrated circuit memory system employing silicon rich layers von CHANG KUO-TUNG, SUH YOUSEOK, HOLBROOK ALLISON, SHIRAIWA HIDEHIKO, FANG SHENQING, TORII SATOSHI, JOSHI AMOL RAMESH, MATSUMOTO DAVID H, BELL SCOTT A, SACHAR HARPREET, YANG CHIH-YUH, SINGH LOVEJEET

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Integrated circuit memory system employing silicon rich layers von Joshi, Amol Ramesh, Sachar, Harpreet, Suh, YouSeok, Fang, Shenqing, Yang, Chih-Yuh, Singh, Lovejeet, Matsumoto, David H, Shiraiwa, Hidehiko, Chang, Kuo-Tung, Bell, Scott A, Holbrook, Allison, Torii, Satoshi

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NAND MEMORY WITH SILICON-RICH CHARGE STORAGE LAYERS AND MANUFACTURING METHOD THEREOF USING SELF-ALIGNED SHALLOW-TRENCH ISOLATION von CHANG, KUO-TUNG, YANG, CHIH-YUH, MATSUMOTO, DAVID, H, HOLBROOK, ALLISON, SUH, YOUSEOK, FANG, SHENQING, TORII, SATOSHI, SHIRAIWA, HIDEHIKO, SACHAR, HARPREET, BELL, SCOTT, A, JOSHI, AMOL, RAMESH, SINGH, LOVEJEET

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INTEGRATED CIRCUIT MEMORY SYSTEM EMPLOYING SILICON RICH LAYERS von CHANG, KUO-TUNG, YANG, CHIH-YUH, MATSUMOTO, DAVID, H, HOLBROOK, ALLISON, SUH, YOUSEOK, FANG, SHENQING, TORII, SATOSHI, SHIRAIWA, HIDEHIKO, SACHAR, HARPREET, BELL, SCOTT, A, JOSHI, AMOL, RAMESH, SINGH, LOVEJEET

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