Taking Ethnography to Court: Pedagogical Reflections on a Collective Field Study von Seim, Josh, Adams, Jamie, Huang, Jiayu, Ortiz, Gabi Celia, de Paula, Tiago Franco, Yang, Jier

Volltext

New Observations in LOD Effect of 45-nm P-MOSFETs With Strained SiGe Source/Drain and Dummy Gate von Chung-Yun Cheng, Yean-Kuen Fang, Jang-Cheng Hsieh, Sheng-Jier Yang, Yi-Ming Sheu, Hsia, H.

Volltext

Opioid prescriber screening practices to detect risk for developing opioid use disorder: Qualitative perspectives from providers during the fourth wave of the opioid crisis von Skeer, Margie R., Yang, Jier, Booth, Michael, Robison, Evan, Hajinazarian, Grace, Boyadjian, Tamar, Sabelli, Rachael A., Chui, Kenneth, Stopka, Thomas J.

Volltext

Modeling the Well-Edge Proximity Effect in Highly Scaled MOSFETs von Yi-Ming Sheu, Ke-Wei Su, Tian, S., Sheng-Jier Yang, Chih-Chiang Wang, Ming-Jer Chen, Liu, S.

Volltext

Modeling mechanical stress effect on dopant diffusion in scaled MOSFETs von Yi-Ming Sheu, Sheng-Jier Yang, Chih-Chiang Wang, Chih-Sheng Chang, Li-Ping Huang, Tsung-Yi Huang, Ming-Jer Chen, Diaz, C.H.

Volltext

Modeling mechanical stress effect on dopant diffusion in scaled MOSFETs von Yi-Ming Sheu, Yi-Ming Sheu, Sheng-Jier Yang, Sheng-Jier Yang, Chih-Chiang Wang, Chih-Chiang Wang, Chih-Sheng Chang, Chih-Sheng Chang, Li-Ping Huang, Li-Ping Huang, Tsung-Yi Huang, Tsung-Yi Huang, Ming-Jer Chen, Ming-Jer Chen, Diaz, C.H

Volltext

Reproducing Subthreshold Characteristics of Metal–Oxide–Semiconductor Field Effect Transistors under Shallow Trench Isolation Mechanical Stress Using a Stress-Dependent Diffusion M... von Sheu, Yi-Ming, Yang, Sheng-Jier, Wang, Chih-Chiang, Chang, Chih-Sheng, Chen, Ming-Jer, Liu, Sally, Diaz, Carlos H.

Volltext

Modeling well edge proximity effect on highly-scaled MOSFETs von Yi-Ming Sheu, Ke-Wei Su, Sheng-Jier Yang, Hsien-Te Chen, Chih-Chiang Wang, Ming-Jer Chen, Liu, S.

Volltext

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THEREOF von YANG, Sheng-Jier

Volltext bestellen

Semiconductor device and method of manufacturing thereof von Yang, Sheng-Jier

Volltext bestellen

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THEREOF von YANG, Sheng-Jier

Volltext bestellen

Device And Method For Tuning Threshold Voltage By Implementing Different Work Function Metals In Different Segments Of A Gate von Yang, Sheng-Jier, Chiu, Tai-Hsin

Volltext bestellen

Device and method for tuning threshold voltage by implementing different work function metals in different segments of a gate von Yang, Sheng-Jier, Chiu, Tai-Hsin

Volltext bestellen

Method of manufacturing a semiconductor device von YANG, SHENG-JIER

Volltext bestellen

Device and Method for Tuning Threshold Voltage by Implementing Different Work Function Metals in Different Segments of a Gate von Yang, Sheng-Jier, Chiu, Tai-Hsin

Volltext bestellen

Device and method for tuning threshold voltage by implementing different work function metals in different segments of a gate von Yang, Sheng-Jier, Chiu, Tai-Hsin

Volltext bestellen

DEVICE AND METHOD FOR TUNING THRESHOLD VOLTAGE BY IMPLEMENTING DIFFERENT WORK FUNCTION METALS IN DIFFERENT SEGMENTS OF A GATE von Yang, Sheng-Jier, Chiu, Tai-Hsin

Volltext bestellen

Modeling mechanical stress effect on dopant diffusion in scaled MOSFETs von Yi-Ming Sheu, Yang, Sheng-Jier, Chih-Chiang, Wang, Chih-Sheng, Chang, Li-Ping, Huang, Tsung-Yi Huang, Chen, Ming-Jer, Diaz, C H

Volltext

TWO-TRANSISTOR BANDGAP REFERENCE CIRCUIT AND FINFET DEVICE SUITED FOR SAME von Huang, Peter, Lin, Yvonne, Rousseau, Paul, Yang, Sheng-Jier, Lin, Da-Wen

Volltext bestellen

Two-transistor bandgap reference circuit and FinFET device suited for same von Huang, Peter, Lin, Yvonne, Rousseau, Paul, Yang, Sheng-Jier, Lin, Da-Wen

Volltext bestellen