Dirac electrons in a dodecagonal graphene quasicrystal von Ahn, Sung Joon, Moon, Pilkyung, Kim, Tae-Hoon, Kim, Hyun-Woo, Shin, Ha-Chul, Kim, Eun Hye, Cha, Hyun Woo, Kahng, Se-Jong, Kim, Philip, Koshino, Mikito, Son, Young-Woo, Yang, Cheol-Woong, Ahn, Joung Real

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Wafer‐Scale and Low‐Temperature Growth of 1T‐WS2 Film for Efficient and Stable Hydrogen Evolution Reaction von Kim, Hyeong‐U, Kanade, Vinit, Kim, Mansu, Kim, Ki Seok, An, Byeong‐Seon, Seok, Hyunho, Yoo, Hocheon, Chaney, Lindsay E., Kim, Seung‐Il, Yang, Cheol‐Woong, Yeom, Geun Yong, Whang, Dongmok, Lee, Jae‐Hyun, Kim, Taesung

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Electrically Driven Reversible Phase Changes in Layered In2Se3 Crystalline Film von Choi, Min Sup, Cheong, Byung‐ki, Ra, Chang Ho, Lee, Suyoun, Bae, Jee‐Hwan, Lee, Sungwoo, Lee, Gun‐Do, Yang, Cheol‐Woong, Hone, James, Yoo, Won Jong

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Wafer-Scale Growth of Single-Crystal Monolayer Graphene on Reusable Hydrogen-Terminated Germanium von Lee, Jae-Hyun, Lee, Eun Kyung, Joo, Won-Jae, Jang, Yamujin, Kim, Byung-Sung, Lim, Jae Young, Choi, Soon-Hyung, Ahn, Sung Joon, Ahn, Joung Real, Park, Min-Ho, Yang, Cheol-Woong, Choi, Byoung Lyong, Hwang, Sung-Woo, Whang, Dongmok

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Random laser ablated tags for anticounterfeiting purposes and towards physically unclonable functions von Gandla, Srinivas, Yoon, Jinsik, Yang, Cheol‑Woong, Lee, HyungJune, Park, Wook, Kim, Sunkook

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High‐κ Dielectric (HfO2)/2D Semiconductor (HfSe2) Gate Stack for Low‐Power Steep‐Switching Computing Devices von Kang, Taeho, Park, Joonho, Jung, Hanggyo, Choi, Haeju, Lee, Sang‐Min, Lee, Nayeong, Lee, Ryong‐Gyu, Kim, Gahye, Kim, Seung‐Hwan, Kim, Hyung‐jun, Yang, Cheol‐Woong, Jeon, Jongwook, Kim, Yong‐Hoon, Lee, Sungjoo

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Author Correction: Random laser ablated tags for anticounterfeiting purposes and towards physically unclonable functions von Gandla, Srinivas, Yoon, Jinsik, Yang, Cheol‑Woong, Lee, HyungJune, Park, Wook, Kim, Sunkook

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Determination of Dy substitution site in Nd2−xDyxFe14B by HAADF-STEM and illustration of magnetic anisotropy of “g” and “f” sites, before and after substitution von Haider, Syed Kamran, Kang, Min-Chul, Hong, Jisang, Kang, Young Soo, Yang, Cheol-Woong, Kim, Dongsoo

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Evidence of Graphitic AB Stacking Order of Graphite Oxides von Jeong, Hae-Kyung, Lee, Yun Pyo, Lahaye, Rob J. W. E, Park, Min-Ho, An, Kay Hyeok, Kim, Ick Jun, Yang, Cheol-Woong, Park, Chong Yun, Ruoff, Rodney S, Lee, Young Hee

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The Third East‐Asia Microscopy Conference (EAMC3) von Rhyu, Im Joo, Yang, Cheol‐Woong, Lee, Zonghoon

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Atomic structure and growth mechanism of T1 precipitate in Al–Cu–Li–Mg–Ag alloy von Kang, Sung Jin, Kim, Tae-Hoon, Yang, Cheol-Woong, Lee, Je In, Park, Eun Soo, Noh, Tae Won, Kim, Miyoung

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Bipolar Resistive Switching Characteristics of Ta/TaxMnyOz/Pt Structure for ReRAM Application with Large Resistance Window von Kim, Yunki, Jo, Kyu-Jin, Oh, Jin-Su, Yang, Cheol-Woong

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Active-matrix monolithic gas sensor array based on MoS2 thin-film transistors von Kim, Sehwan, Park, Heekyeong, Choo, Sooho, Baek, Seongho, Kwon, Yena, Liu, Na, Yang, Jeong Yong, Yang, Cheol-Woong, Yoo, Geonwook, Kim, Sunkook

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Low angle boundary migration of shot‐peened pure nickel investigated by electron channeling contrast imaging and electron backscatter diffraction von Oh, Jin‐Su, Cha, Hyun‐Woo, Kim, Tae‐Hoon, Shin, Keesam, Yang, Cheol‐Woong

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Quantification of crystallinity using zero‐loss filtered electron diffraction von An, Byeong‐Seon, Kwon, Yena, Cha, Hyun‐Woo, Kang, Min‐Chul, Oh, Jin‐Su, Yang, Cheol‐Woong

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Detection of graphene domains and defects using liquid crystals von Son, Jong-Ho, Baeck, Seung-Jae, Park, Min-Ho, Lee, Jae-Bok, Yang, Cheol-Woong, Song, Jang-Kun, Zin, Wang-Cheol, Ahn, Jong-Hyun

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Effect of Electromigration-Induced Joule Heating on the Reliability of Sn-Ag Microbump with Different UBM Structures von Son, Kirak, Park, Gyu-Tae, Lee, Byeong-Rok, Yang, Cheol-Woong, Han, Jeong Sam, Lee, Tae-Kyu, Park, Young-Bae

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Epitaxial Growth of a Single-Crystal Hybridized Boron Nitride and Graphene Layer on a Wide-Band Gap Semiconductor von Shin, Ha-Chul, Jang, Yamujin, Kim, Tae-Hoon, Lee, Jun-Hae, Oh, Dong-Hwa, Ahn, Sung Joon, Lee, Jae Hyun, Moon, Youngkwon, Park, Ji-Hoon, Yoo, Sung Jong, Park, Chong-Yun, Whang, Dongmok, Yang, Cheol-Woong, Ahn, Joung Real

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Novel Method of Measuring the Thickness of Nanoscale Films Using Energy Dispersive X‐Ray Spectroscopy Line Scan Profiles von Kang, Min‐Chul, Oh, Jin‐Su, Song, Kyeong‐Youn, Lee, Hoo‐Jeong, Baik, Hionsuck, Yang, Cheol‐Woong

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Thickness contrast of few-layered graphene in SEM von Park, Min-Ho, Kim, Tae-Hoon, Yang, Cheol-Woong

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