In situ and real‐time monitoring of structure formation during non‐reactive sputter deposition of lanthanum and reactive sputter deposition of lanthanum nitride von Krause, Bärbel, Kuznetsov, Dmitry S., Yakshin, Andrey E., Ibrahimkutty, Shyjumon, Baumbach, Tilo, Bijkerk, Fred

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Influence of the Template Layer on the Structure and Ferroelectric Properties of PbZr0.52Ti0.48O3 Films von Lucke, Philip, Nematollahi, Mohammadreza, Bayraktar, Muharrem, Yakshin, Andrey E., ten Elshof, Johan E., Bijkerk, Fred

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Structural properties of subnanometer thick Y layers in extreme ultraviolet multilayer mirrors von Bosgra, Jeroen, Zoethout, Erwin, van der Eerden, Ad M J, Verhoeven, Jan, van de Kruijs, Robbert W E, Yakshin, Andrey E, Bijkerk, Fred

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Microstructure of Mo/Si multilayers with B4C diffusion barrier layers von Nedelcu, Ileana, van de Kruijs, Robbert W E, Yakshin, Andrey E, Bijkerk, Fred

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Resolving buried interfaces with low energy ion scattering von Valpreda, Adele, Sturm, Jacobus M., Yakshin, Andrey E., Ackermann, Marcelo

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Examining the influence of W thickness on the Si-on-W Interface: A comparative metrology analysis von Valpreda, Adele, Sturm, Jacobus M., Yakshin, Andrey E., Woitok, Joachim, Lokhorst, Hendrik W., Phadke, Parikshit, Ackermann, Marcelo

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Double matrix effect in Low Energy Ion Scattering from La surfaces von Zameshin, Andrey A., Yakshin, Andrey E., Sturm, Jacobus M., Brongerma, Hidde H., Bijkerk, Fred

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Reconstruction of interfaces of periodic multilayers from X-ray reflectivity using a free-form approach von Zameshin, Andrey, Makhotkin, Igor A., Yakunin, Sergey N., van de Kruijs, Robbert W. E., Yakshin, Andrey E., Bijkerk, Fred

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Influence of the Template Layer on the Structure and Ferroelectric Properties of PbZr 0.52 Ti 0.48 O 3 Films von Lucke, Philip, Nematollahi, Mohammadreza, Bayraktar, Muharrem, Yakshin, Andrey E., ten Elshof, Johan E., Bijkerk, Fred

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Influence of DC Bias on the Hysteresis, Loss, and Nonlinearity of Epitaxial PbZr0.55Ti0.45O3 Films von Lucke, Philip, Bayraktar, Muharrem, Schukkink, Niels, Yakshin, Andrey E., Rijnders, Guus, Bijkerk, Fred, Houwman, Evert P.

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Influence of DC Bias on the Hysteresis, Loss, and Nonlinearity of Epitaxial PbZr 0.55 Ti 0.45 O 3 Films von Lucke, Philip, Bayraktar, Muharrem, Schukkink, Niels, Yakshin, Andrey E., Rijnders, Guus, Bijkerk, Fred, Houwman, Evert P.

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Determination of crystallization as a function of Mo layer thickness in Mo/Si multilayers von Abdali, Salim, Gerward, Leif, Yakshin, Andrey E., Louis, Eric, Bijkerk, Fred

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Limits of surface analysis of thin film compounds using LEIS von Zameshin, Andrey A, Yakshin, Andrey E, Sturm, Jacobus M, Boas, Cristiane Stilhano Vilas, Bijkerk, Fred

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REFLECTIVE OPTICAL ELEMENT von Kuznetsov, Dmitry, Enkisch, Hartmut, Bijkerk, Frederik, Yakshin, Andrey E, Medvedev, Viacheslav

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Processes and device for the deposition of films on substrates von FUKAREK WOLFGANG, YAKSHIN ANDREY E

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Limits of surface analysis of thin film compounds using LEIS von Zameshin, Andrey A, Yakshin, Andrey E, Sturm, Jacobus M, Cristiane Stilhano Vilas Boas, Bijkerk, Fred

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PROCESSES AND DEVICE FOR THE DEPOSITION OF FILMS ON SUBSTRATES von FUKAREK WOLFGANG, YAKSHIN ANDREY E

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Processes and device for the deposition of films on substrates von FUKAREK WOLFGANG, YAKSHIN ANDREY E

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Processes and device for the deposition of films on substrates von Yakshin, Andrey E, Fukarek, Wolfgang

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Reflektives optisches Element und optisches System von Zameshin, Andrey, Bijkerk, Frederik, Yakshin, Andrey E

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