P‐9: Reduction and Mechanism of ESD Defect in IGZO‐TFT Formation von Liu, Tianzhen, Duan, Xianxue, Xu, Dezhi, Cui, Haifeng, Zhang, Zhihai, Youn, YangSik, Chen, Junsheng, Lee, SeungKyu

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P‐62: Study on the mechanism of Block Mura in the ITO developing process via utilizing CFD simulation von Li, Xiaobao, Zhang, Zhihai, Chen, Cheng, Liu, Zhaofan, YOUN, YANGSIK, Chen, Junsheng, LEE, SEUNGKYU

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P‐70: Resolving Bump Issue on Copper Surface in GI Hole of TFT‐LCDs von Wang, Yijun, Shen, Qiyu, Wang, Jianwei, Liu, Zuhong, Xu, Xufei, Liu, Zhaofan, Zhang, Xiaojie, Zhang, Zhihai, Youn, YangSik, Chen, Junsheng, Lee, SeungKyu

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P‐74: Study on the influence factors of TFT glass strength von Tian, Wei, Zhang, Zhihai, Duan, Xianxue, Zhang, Jun, Youn, Yangsik, Chen, Junsheng, Lee, SeungKyu, Zhao, Na, Yuan, Miao, Shi, Gaofei

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P-201L: Late-News Poster: Modeling and Improvement of Invisible ITO Pattern on Touch Screen von Xu, Dezhi, Shi, Gaofei, Duan, Xianxue, Baek, Myoung Kee, Youn, Yangsik, Che, Chuncheng, Lee, SeungKyu

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