Gold-coated silver nanowires for long lifetime AFM-TERS probes von Wen, Han, Inose, Tomoko, Hirai, Kenji, Akashi, Taiki, Sugioka, Shoji, Li, Jiangtao, Peeters, Wannes, Fron, Eduard, Fortuni, Beatrice, Nakata, Yoshihiko, Rocha, Susana, Toyouchi, Shuichi, Fujita, Yasuhiko, Uji-i, Hiroshi

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What size of cluster is most appropriate for SIMS? von Matsuo, Jiro, Ninomiya, Satoshi, Nakata, Yoshihiko, Honda, Yoshiro, Ichiki, Kazuya, Seki, Toshio, Aoki, Takaaki

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Comparison of MeV monomer ion and keV cluster ToF-SIMS von Jones, Brian N., Matsuo, Jiro, Nakata, Yoshihiko, Yamada, Hideaki, Watts, John, Hinder, Steven, Palitsin, Vladimir, Webb, Roger

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MeV-energy probe SIMS imaging of major components in animal cells etched using large gas cluster ions von Yamada, Hideaki, Ichiki, Kazuya, Nakata, Yoshihiko, Ninomiya, Satoshi, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Size effect in cluster collision on solid surfaces von Matsuo, Jiro, Ninomiya, Satoshi, Nakata, Yoshihiko, Ichiki, Kazuya, Aoki, Takaaki, Seki, Toshio

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The effect of incident cluster ion energy and size on secondary ion yields emitted from Si von Ninomiya, Satoshi, Ichiki, Kazuya, Nakata, Yoshihiko, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams von Ninomiya, Satoshi, Ichiki, Kazuya, Yamada, Hideaki, Nakata, Yoshihiko, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams von Ninomiya, Satoshi, Ichiki, Kazuya, Yamada, Hideaki, Nakata, Yoshihiko, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Profiling with Depth Resolution of Sub-nm for SiO2/ SiC Interface by Dual-Beam TOF-SIMS Combined with Simulation von Sameshima, Junichiro, Muraji, Yuichi, Takenaka, Aya, Yoshikawa, Masanobu, Nakata, Yoshihiko

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Gold-coated silver nanowires for long lifetime AFM-TERS probes von Wen, Han, Inose, Tomoko, Hirai, Kenji, Akashi, Taiki, Sugioka, Shoji, Li, Jiangtao, Peeters, Wannes, Fron, Eduard, Fortuni, Beatrice, Nakata, Yoshihiko, Rocha, Susana, Toyouchi, Shuichi, Fujita, Yasuhiko, Uji-i, Hiroshi

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Measurements of secondary ions emitted from organic compounds bombarded with large gas cluster ions von Ninomiya, Satoshi, Nakata, Yoshihiko, Ichiki, Kazuya, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions von Ninomiya, Satoshi, Nakata, Yoshihiko, Honda, Yoshiro, Ichiki, Kazuya, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Use of ionic liquids in SIMS depth profiling von Nakata, Yoshihiko, Fujiyama, Noriyuki, Sameshima, Junichiro, Yoshikawa, Masanobu

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SIMS Depth Profiling of Organic Materials with Ar Cluster Ion Beam von Ninomiya, Satoshi, Ichiki, Kazuya, Yamada, Hideaki, Nakata, Yoshihiko, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Processing Techniques of Biomaterials Using Ar Cluster Ion Beam for Imaging Mass Spectrometry von Yamada, Hideaki, Ichiki, Kazuya, Nakata, Yoshihiko, Ninomiya, Satoshi, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Analysis of organic semiconductor multilayers with Ar cluster secondary ion mass spectrometry von Ninomiya, Satoshi, Ichiki, Kazuya, Yamada, Hideaki, Nakata, Yoshihiko, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Matrix-free high-resolution imaging mass spectrometry with high-energy ion projectiles von Nakata, Yoshihiko, Honda, Yoshiro, Ninomiya, Satoshi, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Low Damage Etching of Polymer Materials for Depth Profile Analysis Using Large Ar Cluster Ion Beam von Ninomiya, Satoshi, Ichiki, Kazuya, Yamada, Hideaki, Nakata, Yoshihiko, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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A Processing Technique for Cell Surfaces Using Gas Cluster Ions for Imaging Mass Spectrometry von YAMADA, Hideaki, ICHIKI, Kazuya, NAKATA, Yoshihiko, NINOMIYA, Satoshi, SEKI, Toshio, AOKI, Takaaki, MATSUO, Jiro

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The effect of incident energy on molecular depth profiling of polymers with large Ar cluster ion beams von Ninomiya, Satoshi, Ichiki, Kazuya, Yamada, Hideaki, Nakata, Yoshihiko, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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