An Example of Application of Machine Learning Method to Laboratory Medicine: Determination of Newborn Reference Ranges von Oktay YILDIRIM, Özlem AKTAŞ, Ali Rıza ŞİŞMAN, Dilek ORBATU, Senem ALKAN ÖZDEMİR, Adem AYDIN, Eminullah YAŞAR, Mohammed Abebe YİMER, Süleyman SEVİNÇ

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Opportunities and Challenges for Drug Development: Public-Private Partnerships, Adaptive Designs and Big Data von Yildirim, Oktay, Gottwald, Matthias, Schüler, Peter, Michel, Martin C

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Novel High Sensitivity EUV Photoresist for Sub-7 nm Node von Nagai, Tomoki, Nakagawa, Hisashi, Naruoka, Takehiko, Dei, Satoshi, Tagawa, Seiichi, Oshima, Akihiro, Nagahara, Seiji, Shiraishi, Gosuke, Yoshihara, Kosuke, Terashita, Yuichi, Minekawa, Yukie, Buitrago, Elizabeth, Ekinci, Yasin, Yildirim, Oktay, Meeuwissen, Marieke, Hoefnagels, Rik, Rispens, Gijsbert, Verspaget, Coen, Maas, Raymond

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Electrochemical Stability of Self-Assembled Alkylphosphate Monolayers on Conducting Metal Oxides von Yildirim, Oktay, Yilmaz, M. Deniz, Reinhoudt, David N, Blank, Dave H. A, Rijnders, Guus, Huskens, Jurriaan

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Monolayer-directed assembly and magnetic properties of FePt nanoparticles on patterned aluminum oxide von Yildirim, Oktay, Gang, Tian, Kinge, Sachin, Reinhoudt, David N, Blank, Dave H, van der Wiel, Wilfred G, Rijnders, Guus, Huskens, Jurriaan

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The effect of an artificial intelligence algorithm on chest X-ray interpretation of radiology residents von Pekçevik, Yeliz, Orbatu, Dilek, Güngör, Fatih, Yıldırım, Oktay, Yaşar, Eminullah, Yimer, Mohammed Abebe, Şişman, Ali Rıza, Emiroğlu, Mustafa, Dao, Lan, Cohen, Joseph Paul, Sevinç, Süleyman

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Monitoring the Treatments and Interventions to Intensive Care Patients: A Study for Multidimensional Evaluation of Changes in Patient Test Results with Principal Component Analysis von YİMER, Mohammed Abebe, SEVİNÇ, Süleyman, ŞİŞMAN, Ali Rıza, AKTAŞ, Özlem, YILDIRIM, Oktay, YAŞAR, Eminullah

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ENKAZ ALTINDA KALAN KİŞİLERİN KONUM BİLGİLERİNİ ÖNCESİNDE BULUTA YÜKLEYEN VE SESLİ, IŞIKLI UYARI VEREN CİHAZ von OKTAY, YILDIRIM

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Estimating How Many Phylebotomists are Required in the Phylebotomy Unit: An Artificial Intelligence Study von Orbatu, Dilek, Yıldırım, Oktay, Pakdemirli, Ahu, Yaşar, Eminullah, Alaygut, Demet, Sevinç, Süleyman, Şişman, Ali Rıza

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System for Planning and Performing Staging of Medical Investigations for Diagnosis von Yaşar, Eminullah, Yıldırım, Oktay, Miman, Yiğit Ege, Şişman, Ali Rıza, Sevinç, Süleyman

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Method for adjusting a target feature in a model of a patterning process based on local electric fields von Van Dijk, Leon Paul, Van Haren, Richard Johannes Franciscus, Yildirim, Oktay, Mouraille, Orion Jonathan Pierre

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Lithographic patterning process and resists to use therein von Wuister, Sander Frederik, Yildirim, Oktay, Polyakov, Alexey Olegovich, Rispens, Gijsbert

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Dielectric behavior of self-assembled monolayers on conducting metal oxidesElectronic supplementary information (ESI) available: Structure of TDP, AFM of Nb-STO, optical images and... von Yildirim, Oktay, de Veen, Peter J, Maas, Michiel G, Nguyen, Minh D, Reinhoudt, David N, Blank, Dave H. A, Rijnders, Guus, Huskens, Jurriaan

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METHOD FOR ADJUSTING A TARGET FEATURE IN A MODEL OF A PATTERNING PROCESS BASED ON LOCAL ELECTRIC FIELDS von MOURAILLE, Orion Jonathan Pierre, VAN DIJK, Leon Paul, VAN HAREN, Richard Johannes Franciscus, YILDIRIM, Oktay

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Method for adjusting a target feature in a model of a patterning process based on local electric fields von Van Dijk, Leon Paul, Van Haren, Richard Johannes Franciscus, Yildirim, Oktay, Mouraille, Orion Jonathan Pierre

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Dielectric behavior of self-assembled monolayers on conducting metal oxides von Yildirim, Oktay, de Veen, Peter J, Maas, Michiel G, Nguyen, Minh D, Reinhoudt, David N, Blank, Dave HA, Rijnders, Guus, Huskens, Jurriaan

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METHOD FOR ADJUSTING A TARGET FEATURE IN A MODEL OF A PATTERNING PROCESS BASED ON LOCAL ELECTRIC FIELDS von MOURAILLE, Orion, VAN DIJK, Leon, YILDIRIM, Oktay, VAN HAREN, Richard

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METHOD FOR ADJUSTING A TARGET FEATURE IN A MODEL OF A PATTERNING PROCESS BASED ON LOCAL ELECTRIC FIELDS von MOURAILLE, Orion Jonathan Pierre, VAN DIJK, Leon Paul, VAN HAREN, Richard Johannes Franciscus, YILDIRIM, Oktay

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Lithographic Patterning Process and Resists to Use Therein von WUISTER, Sander Frederik, YiLDiRiM, Oktay, POLYAKOV, Alexey Olegovich, RISPENS, Gijsbert

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Lithographic patterning process and resists to use therein von Wuister, Sander Frederik, Yildirim, Oktay, Polyakov, Alexey Olegovich, Rispens, Gijsbert

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