Nitrogen Gas Field Ion Source (GFIS) Focused Ion Beam (FIB) Secondary Electron Imaging: A First Look von Schmidt, Marek E., Yasaka, Anto, Akabori, Masashi, Mizuta, Hiroshi

Volltext

Thermal Stability of Single-Atom Termination at a Pyramidal Apex of an Ir-W Tip von Oshima, Chuhei, Tomitori, Masahiko, Shimoda, Tatsuya, Yasaka, Anto, Asai, Hirotaka, Rokuta, Eiji

Volltext

Deposition Yield and Physical Properties of Carbon Films Deposited by Focused-Ion-Beam Chemical Vapor Deposition von Kaito, Takashi, Oba, Hiroshi, Sugiyama, Yasuhiko, Yasaka, Anto, Fujita, Jun-ichi, Suzuki, Tsuneo, Kanda, Kazuhiro, Matsui, Shinji

Volltext

Interaction study of nitrogen ion beam with silicon von Schmidt, Marek E., Zhang, Xiaobin, Oshima, Yoshifumi, Anh, Le The, Yasaka, Anto, Kanzaki, Teruhisa, Muruganathan, Manoharan, Akabori, Masashi, Shimoda, Tatsuya, Mizuta, Hiroshi

Volltext

High-In-content InGaAs quantum point contacts fabricated using focused ion beam system equipped with N 2 gas field ion source von Akabori, Masashi, Hidaka, Shiro, Yamada, Syoji, Kozakai, Tomokazu, Matsuda, Osamu, Yasaka, Anto

Volltext

High-In-content InGaAs quantum point contacts fabricated using focused ion beam system equipped with N2 gas field ion source von Akabori, Masashi, Hidaka, Shiro, Yamada, Syoji, Kozakai, Tomokazu, Matsuda, Osamu, Yasaka, Anto

Volltext

Observing graphene and graphite by nitrogen ion beam microscopy von Schmidt, Marek, Yasaka, Anto, Mizuta, Hiroshi

Volltext

High-In-content InGaAs quantum point contacts fabricated using focused ion beam system equipped with N sub(2) gas field ion source von Akabori, Masashi, Hidaka, Shiro, Yamada, Syoji, Kozakai, Tomokazu, Matsuda, Osamu, Yasaka, Anto

Volltext

Energy Analysis of H3+ Ion Beam Emitted from Gas field ionization source von Matsubara, Shinichi, Shichi, Hiroyasu, Hashizume, Tomihiro, Yasaka, Anto

Volltext

Surface Morphology of Diamond-Like Carbon Film and Si Wafer Milled with 30 keV Gallium Focused Ion Beam von Kaito, Takashi, Yasutake, Masatoshi, Yasaka, Anto, Miyamoto, Iwao

Volltext

Interaction of gas field ionized nitrogen with silicon von Schmidt, Marek Edward, Zhang, Xiaobin, Oshima, Yoshifumi, Anh, Le The, Yasaka, Anto, Kanzaki, Teruhisa, Muruganathan, Manoharan, Akabori, Masashi, Shimoda, Tatsuya, Mizuta, Hiroshi

Volltext

ガス電界電離イオン源から放出されるH3+ビームのエネルギー特性評価 von 松原, 信一, 志知, 広康, 橋詰, 富博, Anto, Yasaka

Volltext

Image quality improvement in focused ion beam photomask repair system von Yasaka, Anto, Aramaki, Fumio, Muramatsu, Masashi, Kozakai, Tomokazu, Matsuda, Osamu, Sugiyama, Yasuhiko, Doi, Toshio, Takaoka, Osamu, Hagiwara, Ryoji, Nakamae, Koji

Volltext

Post-thinning technique for a lifted-out membrane von Sadayama, Shoji, Sugiyama, Yasuhiko, Iwasaki, Koji, Yasaka, Anto

Volltext

Ion source and electron source having single-atom termination structure, tip having single-atom termination structure, gas field ion source, focused ion beam apparatus, electron so... von Shimoda, Tatsuya, Yasaka, Anto, Tomitori, Masahiko, Oshima, Chuhei

Volltext bestellen

ION SOURCE AND ELECTRON SOURCE HAVING SINGLE-ATOM TERMINATION STRUCTURE, TIP HAVING SINGLE-ATOM TERMINATION STRUCTURE, GAS FIELD ION SOURCE, FOCUSED ION BEAM APPARATUS, ELECTRON SO... von YASAKA, Anto, TOMITORI, Masahiko, OSHIMA, Chuhei, SHIMODA, Tatsuya

Volltext bestellen

Emitter structure, gas ion source and focused ion beam system von Yasaka Anto, Sugiyama Yasuhiko, Oba Hiroshi

Volltext bestellen

EMITTER STRUCTURE, GAS ION SOURCE AND FOCUSED ION BEAM SYSTEM von YASAKA ANTO, SUGIYAMA YASUHIKO, OBA HIROSHI

Volltext bestellen

Emitter structure, gas ion source and focused ion beam system von YASAKA ANTO, SUGIYAMA YASUHIKO, OBA HIROSHI

Volltext bestellen

Method for acquiring image and ion beam apparatus von Yasaka, Anto, Matsuda, Osamu, Shiina, Kensuke, Kozakai, Tomokazu, Aramaki, Fumio, Aita, Kazuo

Volltext bestellen