Photon-accelerated negative bias instability involving subgap states creation in amorphous In-Ga-Zn-O thin film transistor von Oh, Himchan, Yoon, Sung-Min, Ryu, Min Ki, Hwang, Chi-Sun, Yang, Shinhyuk, Park, Sang-Hee Ko

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Transparent and Photo-stable ZnO Thin-film Transistors to Drive an Active Matrix Organic-Light- Emitting-Diode Display Panel von Park, Sang-Hee K., Hwang, Chi-Sun, Ryu, Minki, Yang, Shinhyuk, Byun, Chunwon, Shin, Jaeheon, Lee, Jeong-Ik, Lee, Kimoon, Oh, Min Suk, Im, Seongil

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An ‘aqueous route’ for the fabrication of low-temperature-processable oxide flexible transparent thin-film transistors on plastic substrates von Hwan Hwang, Young, Seo, Jin-Suk, Moon Yun, Je, Park, HyungJin, Yang, Shinhyuk, Ko Park, Sang-Hee, Bae, Byeong-Soo

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Improvement in the photon-induced bias stability of Al–Sn–Zn–In–O thin film transistors by adopting AlOx passivation layer von Yang, Shinhyuk, Cho, Doo-Hee, Ryu, Min Ki, Park, Sang-Hee Ko, Hwang, Chi-Sun, Jang, Jin, Jeong, Jae Kyeong

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Impact of Sn/Zn ratio on the gate bias and temperature-induced instability of Zn-In-Sn-O thin film transistors von Ryu, Min Ki, Yang, Shinhyuk, Park, Sang-Hee Ko, Hwang, Chi-Sun, Jeong, Jae Kyeong

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Transition of dominant instability mechanism depending on negative gate bias under illumination in amorphous In-Ga-Zn-O thin film transistor von Oh, Himchan, Yoon, Sung-Min, Ryu, Min Ki, Hwang, Chi-Sun, Yang, Shinhyuk, Park, Sang-Hee Ko

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Suppression in the negative bias illumination instability of Zn-Sn-O transistor using oxygen plasma treatment von Yang, Shinhyuk, Hwan Ji, Kwang, Ki Kim, Un, Seong Hwang, Cheol, Ko Park, Sang-Hee, Hwang, Chi-Sun, Jang, Jin, Kyeong Jeong, Jae

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Transparent Al-Zn-Sn-O thin film transistors prepared at low temperature von Cho, Doo-Hee, Yang, Shinhyuk, Byun, Chunwon, Shin, Jaeheon, Ryu, Min Ki, Park, Sang-Hee Ko, Hwang, Chi-Sun, Chung, Sung Mook, Cheong, Woo-Seok, Yoon, Sung Min, Chu, Hye-Yong

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Origin of Degradation Phenomenon under Drain Bias Stress for Oxide Thin Film Transistors using IGZO and IGO Channel Layers von Bak, Jun Yong, Kang, Youngho, Yang, Shinhyuk, Ryu, Ho-Jun, Hwang, Chi-Sun, Han, Seungwu, Yoon, Sung-Min

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Low-Temperature Processed Flexible In-Ga-Zn-O Thin-Film Transistors Exhibiting High Electrical Performance von YANG, Shinhyuk, JUN YONG BAK, YOON, Sung-Min, MIN KI RYU, OH, Himchan, HWANG, Chi-Sun, GI HEON KIM, SANG-HEE KO PARK, JIN JANG

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High-Performance Al-Sn-Zn-In-O Thin-Film Transistors: Impact of Passivation Layer on Device Stability von YANG, Shinhyuk, CHO, Doo-Hee, MIN KI RYU, KO PARK, Sang-Hee, HWANG, Chi-Sun, JIN JANG, JAE KYEONG JEONG

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Impact of device configuration on the temperature instability of Al-Zn-Sn-O thin film transistors von Jeong, Jae Kyeong, Yang, Shinhyuk, Cho, Doo-Hee, Park, Sang-Hee Ko, Hwang, Chi-Sun, Cho, Kyoung Ik

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Negative-Bias Light Stress Instability Mechanisms of the Oxide-Semiconductor Thin-Film Transistors Using In-Ga-O Channel Layers Deposited With Different Oxygen Partial Pressures von Bak, Jun Yong, Yang, Shinhyuk, Ryu, Ho-Jun, Park, Sang Hee Ko, Hwang, Chi Sun, Yoon, Sung Min

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Flexible Nonvolatile Memory Thin-Film Transistor Using Ferroelectric Copolymer Gate Insulator and Oxide Semiconducting Channel von Yoon, Sung-Min, Yang, Shinhyuk, Park, Sang-Hee Ko

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Water-related abnormal instability of transparent oxide/organic hybrid thin film transistors von Yang, Shinhyuk, Hwang, Chi-Sun, Lee, Jeong-Ik, Yoon, Sung-Min, Ryu, Min-Ki, Cho, Kyoung-Ik, Park, Sang-Hee Ko, Kim, Se-Hyun, Park, Chan-Eon, Jang, Jin

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Nonvolatile memory thin-film transistors using an organic ferroelectric gate insulator and an oxide semiconducting channel von Yoon, Sung-Min, Yang, Shinhyuk, Byun, Chun-Won, Jung, Soon-Won, Ryu, Min-Ki, Park, Sang-Hee Ko, Kim, ByeongHoon, Oh, Himchan, Hwang, Chi-Sun, Yu, Byoung-Gon

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Effect of In-Ga-Zn-O active layer channel composition on process temperature for flexible oxide thin-film transistors von Bak, Jun Yong, Yoon, Sung Min, Yang, Shinhyuk, Kim, Gi Heon, Ko Park, Sang-Hee, Hwang, Chi-Sun

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A Low-Power Scan Driver Circuit for Oxide TFTs von PI, Jae-Eun, RYU, Minki, PARK, Keechan, HWANG, Chi-Sun, YANG, Shinhyuk, SANG-HEE KO PARK, YOON, Sung-Min, LEEM, Hongkyun, KIM, Younkyung, KIM, Joondong, HWAN SOOL OH

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Drain bias effect on the instability of amorphous indium gallium zinc oxide thin film transistor von Seo, Seung-Bum, Park, Han-Sung, Jeon, Jae-Hong, Choe, Hee-Hwan, Seo, Jong-Hyun, Yang, Shinhyuk, Park, Sang-Hee Ko

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Oxide Semiconductor-Based Organic/Inorganic Hybrid Dual-Gate Nonvolatile Memory Thin-Film Transistor von YOON, Sung-Min, YANG, Shinhyuk, RYU, Min-Ki, BYUN, Chun-Won, JUNG, Soon-Won, PARK, Sang-Hee Ko, HWANG, Chi-Sun, CHO, Kyoung-Ik

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