25th Anniversary Message for the SASJ von Yanagiuchi, Katsuaki

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User-side trends in measurement analysis data von Yanagiuchi, Katsuaki

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Introduction to Surface Analysis von Yanagiuchi, Katsuaki

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To Live an Exciting Life in an Unexciting World von Yanagiuchi, Katsuaki

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Introduction to Surface Analysis von Yanagiuchi, Katsuaki

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Depth Analysis of Ta/NiFe/Ta/CoFeB/Ta/NiFe Multilayer Thin Films: Comparison of Atom Probe Tomography and Auger Electron Spectroscopy von Kubota, Masaki, Ishida, Yoichi, Yanagiuchi, Katsuaki, Takamizawa, Hisashi, Nozawa, Yasuko, Ebisawa, Naoki, Shimizu, Yasuo, Toyama, Takeshi, Inoue, Koji, Nagai, Yasuyoshi

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Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle Incidence Ion Beam von Ogiwara, Toshiya, Yanagiuchi, Katsuaki, Yoshikawa, Hideki

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User-side trends in measurement analysis data von Yanagiuchi, Katsuaki

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25th Anniversary Message for the SASJ von Yanagiuchi, Katsuaki

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表面分析研究会設立 25 周年祝辞 von 柳内, 克昭

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計測分析データの利用側の動向について von 柳内, 克昭

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おもしろき こともなき世を おもしろく von 柳内, 克昭

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Elemental Distribution in Multilayer Systems by Laser-Assisted Atom Probe Tomography with Various Analysis Directions von Kubota, Masaki, Takamizawa, Hisashi, Shimizu, Yasuo, Nozawa, Yasuko, Ebisawa, Naoki, Toyama, Takeshi, Ishida, Yoichi, Yanagiuchi, Katsuaki, Inoue, Koji, Nagai, Yasuyoshi

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A Practical Procedure for Surface Protection of a Bulk Specimen in the Air von Yanagiuchi, Katsuaki, Tsuchida, Satoru

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Current Status and Future Perspective of Magnetic Behavior Analysis for Hard Disc Drive Magnetic Recording Heads von YANAGIUCHI, Katsuaki, HIRATA, Kei, ISHIDA, Yoichi

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表面分析概論 von 柳内, 克昭

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Observation of Magnetization Distribution in Soft Underlayer of Perpendicular Magnetic Recording Media by Electron Holography von Hirata, Kei, Yanagisawa, Keiichi, Ishida, Yoichi, Kasai, Hiroto, Yanagiuchi, Katsuaki, Shindo, Daisuke, Tonomura, Akira

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Analysis of Layered Structure at the Surface and Near-surface of Deposited Thin Film Materials by High-resolution Rutherford Backscattering Spectrometry von Yanagiuchi, Katsuaki, Shiramura, Wakako

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Scanning tunneling microscopy image of GeSb2Te4 thin films von TOMINAGA, J, HARATANI, S, HANDA, T, YANAGIUCHI, K

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Impact of Analysis Direction on the Elemental Distribution in Multilayer with Atom Probe Tomography von Kubota, Masaki, Ishida, Yoichi, Yanagiuchi, Katsuaki, Takamizawa, Hisashi, Nozawa, Yasuko, Shimizu, Yasuo, Toyama, Ken, Inoue, Koji, Nagai, Yasuyoshi

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