Application of inter‐professional care model in patients with aneurysmal subarachnoid haemorrhage von Xu, Juan, Wu, Jun, Yan, Haihua

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Hierarchical Comprehensive Context Modeling for Chinese Text Classification von Liu, Jingang, Xia, Chunhe, Yan, Haihua, Xie, Zhipu, Sun, Jie

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Identification and robustness analysis of nonlinear hybrid dynamical system concerning glycerol transport mechanism von Yan, Haihua, Zhang, Xu, Ye, Jianxiong, Feng, Enmin

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Software testing evolution process model and growth of software testing quality von He, ZhiTao, Liu, Chao, Yan, HaiHua

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An Approach of Conformance Verification between Design Models and Code Based on Abstract Syntax Tree von Liu, Zhao, Tian, Yang, Yan, Haihua

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Multimode Illinois Scan Architecture for Test Application Time and Test Data Volume Reduction von Chandra, A., Haihua Yan, Kapur, R.

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An improved supervised learning defect prediction model based on cat swarm algorithm von Wang, Xuchen, Yan, Haihua, Li, Jiayi

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A New Delay Test Based on Delay Defect Detection Within Slack Intervals (DDSI) von Haihua Yan, Singh, A.D.

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Analysis of the influencing factors of abdominal Henoch-Schonlein purpura in children with gastrointestinal bleeding and the clinical value of PLR von Yang, Xiaoqing, Lu, Rong, Liu, Qing, Zhang, Jiangli, Yan, Haihua, Lu, Hairong

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Innovative Deep Neural Network Modeling for Fine-Grained Chinese Entity Recognition von Liu, Jingang, Xia, Chunhe, Yan, Haihua, Xu, Wenjing

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A delay test to differentiate resistive interconnect faults from weak transistor defects von Haihua Yan, Singh, A.D.

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Evaluating the effectiveness of detecting delay defects in the slack interval: a simulation study von Haihua Yan, Singh, A.D.

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Requirement Modeling and Analysis Based on MDA von Hong Jin, Haihua Yan

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A Formal Definition of Software Testing Based on Fuzzy Measure von Zhitao He, Haihua Yan, Chao Liu, Huacan He

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Improvement on ABDOM-Qd and Its Application in Open-Source Community Software Defect Discovery Process von Zhitao He, Haihua Yan, Chao Liu

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Reduce yield loss in delay defect detection in slack interval von Haihua Yan, Singh, A.D.

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Delay Defect Characterization Using Low Voltage Test von Haihua Yan, Singh, A.D., Gefu Xu

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Comparisons and analyses between RTCA DO-178B and GJB5000A, and integration of software process control von Jing Kong, Haihua Yan

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Glue supply device of double-liquid dispensing machine von YAN HAIHUA

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IGBT chip terminal bending device von YAN HAIHUA

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