Development of 3.3 kV SiC-MOSFET: Suppression of Forward Voltage Degradation of the Body Diode von Yamakawa, Satoshi, Nakao, Yukiyasu, Yamamoto, Shigehisa, Tomita, Nobuyuki, Nakata, Shuhei

Volltext

Stacking fault expansion from basal plane dislocations converted into threading edge dislocations in 4H-SiC epilayers under high current stress von Konishi, Kazuya, Yamamoto, Shigehisa, Nakata, Shuhei, Nakamura, Yu, Nakanishi, Yosuke, Tanaka, Takanori, Mitani, Yoichiro, Tomita, Nobuyuki, Toyoda, Yoshihiko, Yamakawa, Satoshi

Volltext

Demonstration of SiC-MOSFET embedding Schottky barrier diode for inactivation of parasitic body diode von Hino, S., Hatta, H., Sadamatsu, K., Nagahisa, Y., Yamamoto, S., Iwamatsu, T., Yamamoto, Y., Imaizumi, M., Nakata, S., Yamakawa, S.

Volltext

Driving Force of Stacking Fault Expansion in 4H-SiC PN Diode by In Situ Electroluminescence Imaging von Yamakawa, Satoshi, Toyoda, Yoshihiko, Konishi, Kazuya, Yamamoto, Shigehisa, Nakata, Shuhei

Volltext

A Large-Scale, Flip-Flop RAM Imitating a Logic LSI for Fast Development of Process Technology von FUJII, Masako, NII, Koji, MAKINO, Hiroshi, OHBAYASHI, Shigeki, IGARASHI, Motoshige, KAWAMURA, Takeshi, YOKOTA, Miho, TSUDA, Nobuhiro, YOSHIZAWA, Tomoaki, TSUTSUI, Toshikazu, TAKESHITA, Naohiko, MURATA, Naofumi, TANAKA, Tomohiro, FUJIWARA, Takanari, ASAHINA, Kyoko, OKADA, Masakazu, TOMITA, Kazuo, TAKEUCHI, Masahiko, YAMAMOTO, Shigehisa, SUGIMOTO, Hiromitsu, SHINOHARA, Hirofumi

Volltext

Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling von Ibe, E., Chung, S.S., ShiJie Wen, Yamaguchi, H., Yahagi, Y., Kameyama, H., Yamamoto, S., Akioka, T.

Volltext

A Novel Feature of Neutron-Induced Multi-Cell Upsets in 130 and 180 nm SRAMs von Yahagi, Y., Yamaguchi, H., Ibe, E., Kameyama, H., Sato, M., Akioka, T., Yamamoto, S.

Volltext

Investigation of the 1SSF origin in 4H-SiC epitaxial layers von Nakamura, Yu, Furusho, Tomoaki, Yamamoto, Shigehisa

Volltext

SEMICONDUCTOR MANUFACTURING APPARATUS von YAMAMOTO, Shigehisa, AKAO, Shinya, KIMURA, Yasuhiro, OKI, Hirofumi

Volltext bestellen

MANUFACTURING METHOD FOR SILICON CARBIDE SEMICONDUCTOR DEVICE von AKAO, Shinya, YAMAMOTO, Shigehisa, NAGAHISA, Yuichi, HONDA, Shigeto

Volltext bestellen

Osteocompatibility of platinum-plated titanium assessed in vitro von Itakura, Yoshinobu, Tajima, Tokuji, Ohoke, Shinobu, Matsuzawa, Junji, Sudo, Hiroko, Yamamoto, Shigehisa

Volltext

Versatility of SEU function and its derivation from the irradiation tests with well-defined white neutron beams von Yahagi, Y., Ibe, E., Yamamoto, S., Yoshino, Y., Sato, M., Takahashi, Y., Kameyama, H., Saito, A., Hidaka, M.

Volltext

In vitro hemopoiesis within a microenvironment created by MC3T3-G2/PA6 preadipocytes von Kodama, Hiro-Aki, Sudo, Hiroko, Koyama, Hideki, Kasai, Shiro, Yamamoto, Shigehisa

Volltext

SILICON CARBIDE SEMICONDUCTOR DEVICE von YAMAMOTO SHIGEHISA

Volltext bestellen

TEM Study on Microstructure of Stacking Fault Nucleation Sites in 4H-SiC P-I-N Diodes von Nakamura, Yu, Frushou, Tomoaki, Yamamoto, Shigehisa

Volltext

Immunohistochemical Localization of VEGF in Developing Human Circumvallate Papillae von Kimiharu AMBE, Yuriko MORO, Toshihiro NAKAGAWA, Shigehisa YAMAMOTO

Volltext

Induction of metallothionein and stimulation of calcification by dexamethasone in cultured clonal osteogenic cells, MC3T3-E1 von Miyahara, Tatsuro, Nemoto, Masaru, Tukamoto, Shinichi, Yamada, Hiroshi, Kozuka, Hiroshi, Kuze, Syougo, Sudo, Hiroko, Yamamoto, Shigehisa

Volltext

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME von YAMAMOTO SHIGEHISA

Volltext bestellen

SILICON CARBIDE CHIP, SILICON CARBIDE WAFER, TEST METHOD FOR SILICON CARBIDE CHIP, AND TEST METHOD FOR SILICON CARBIDE WAFER von KONISHI KAZUYA, YAMAMOTO SHIGEHISA

Volltext bestellen

SILICON CARBIDE SEMICONDUCTOR DEVICE INSPECTION METHOD von YAMAMOTO YASUKI, YAMAMOTO SHIGEHISA

Volltext bestellen