Anderson localization of graphene by helium ion irradiation von Naitou, Y., Ogawa, S.

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Direct nano-patterning of graphene with helium ion beams von Naitou, Y., Iijima, T., Ogawa, S.

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Rectification of force-distance curve using capacitance measurement von Naitou, Y., Ogiso, H., Ookubo, N.

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An analytical model for the capacitance between probe tip and dielectric film deduced by high-frequency electromagnetic-field simulations von Naitou, Y., Yasaka, A., Ookubo, N.

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Investigation of local charged defects within high-temperature annealed HfSiON∕SiO2 gate stacks by scanning capacitance spectroscopy von Naitou, Y., Ando, A., Ogiso, H., Kamiyama, S., Nara, Y., Yasutake, K., Watanabe, H.

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Charge trapping properties in TiO2∕HfSiO∕SiO2 gate stacks probed by scanning capacitance microscopy von Naitou, Y., Arimura, H., Kitano, N., Horie, S., Minami, T., Kosuda, M., Ogiso, H., Hosoi, T., Shimura, T., Watanabe, H.

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Spatial fluctuation of dielectric properties in Hf-based high- k gate films studied by scanning capacitance microscopy von Naitou, Y., Ando, A., Ogiso, H., Kamiyama, S., Nara, Y., Nakamura, K., Watanabe, H., Yasutake, K.

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Study on channel depletion in metal-oxide-semiconductor field effect transistor using top-view imaging through scanning capacitance microscopy von Naitou, Y., Ogiso, H., Kamohara, S., Yano, F., Nishida, A.

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Scanning capacitance microscopy study of carrier depletion within grains of n-type polycrystalline silicon von Naitou, Y., Ogiso, H., Kamohara, S., Yano, F., Nishida, A.

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Measurement of Deuteron Induced Thick Target Neutron Yields at 9 MeV von Shigyo, N., Hidaka, K., Hirabayashi, K., Nakamura, Y., Moriguchi, D., Kumabe, M., Hirano, H., Hirayama, S., Naitou, Y., Motooka, C., Lan, C., Watanabe, T., Watanabe, Y., Sagara, K., Maebaru, S., Sakaki, H., Takahashi, H.

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Light-Ion Production from a Thin Silicon Target Bombarded by 175 MeV Quasi Monoenergetic Neutrons von Watanabe, Y., Hirayama, S., Naitou, Y., Andersson, P., Bevilacqua, R., Gustavsson, C., Osterlund, M., Pomp, S., Simutkin, V., Sjostrand, H., Hjalmarsson, A., Prokofiev, A., Tesinsky, M., Tippawan, U.

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Characterization of ANITA and QMN Neutron Beams at TSL Using Proton Recoil Techniques von Watanabe, Y., Naitou, Y., Hirayama, S., Hayashi, M., Prokofiev, A., Hjalmarsson, A., Pomp, S., Andersson, P., Bevilacqua, R., Gustavsson, C., Osterlund, M., Simutkin, V., Sjostrand, H., Tesinsky, M., Tippawan, U.

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Light-Ion Production in 175 MeV Neutron-Induced Reactions on Oxygen von Tippawan, U., Vilaithong, T., Pomp, S., Andersson, P., Bevilacqua, R., Blomgren, J., Gustavsson, C., Nilsson, L., Osterlund, M., Simutkin, V., Sjostrand, H., Hayashi, M., Hirayama, S., Naitou, Y., Watanabe, Y., Hjalmarsson, A., Prokofiev, A., Tesinsky, M.

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Delineation of a p-n junction using dC/ dX imagery produced by shear-mode scanning capacitance microscopy von NAITOU, Y, OOKUBO, N

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Light-Ion Production in The Interaction of 175 MeV Neutrons with Iron and Bismuth von Bevilacqua, R., Pomp, S., Simutkin, V. D., Tippawan, U., Hayashi, M., Hirayama, S., Naitou, Y., Watanabe, Y., Prokofiev, A. V., Hjalmarsson, A., Andersson, P., Blomgren, J., Osterlund, M., Tesinsky, M., Lecolley, F.-R., Marie, N., Kolozhvari, A.

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Phase relations, dielectric and piezoelectric properties of ceramics in the system (Bi0.5Na0.5)TiO3-PbTiO3 von Sakata, K., Takenaka, T., Naitou, Y.

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A Medley with over ten years of (mostly) light-ion production measurements at The Svedberg Laboratory von Pomp, S., Bevilacqua, R., Hayashi, M., Hirayama, S., Lecolley, F.-R., Marie, N., Naitou, Y., Tippawan, U., Watanabe, Y., Andersson, P., Blomgren, J., Gustavsson, C., Hjalmarsson, A., Prokofiev, A.V., Simutkin, V.D., Tengborn, E., Tesinsky, M., Österlund, M., Kolozhvari, A.

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High-spatial-resolution scanning capacitance microscope using all-metal probe with quartz tuning fork von Naitou, Yuichi, Ookubo, Norio

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Native Graphene Oxides at Graphene Edges von Shimamoto, S., Naitou, Y., Fukuyama, Y., Kiryu, S., Kaneko, N.

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Medley spectrometer for light ions in neutron-induced reactions at 175 MeV von Bevilacqua, Riccardo, Pomp, Stephan, Simutkin, Vasily, Hayashi, Masateru, Hirayama, Shusuke, Naitou, Yuuki, Watanabe, Yukinobu, Tippawan, Udomrat, Tesinsky, Milan, Ban, Gilles, Lecouey, Jean-Luc, Lecolley, François-René, Marie, Nathalie, Hamel, Quentin

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