DOT1L O-GlcNAcylation promotes its protein stability and MLL-fusion leukemia cell proliferation von Song, Tanjing, Zou, Qingli, Yan, Yingying, Lv, Suli, Li, Neng, Zhao, Xuefeng, Ma, Xianyun, Liu, Haigang, Tang, Borui, Sun, Lidong

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EDEM and FLUENT Parameter Finding and Verification Study of Thickener Based on Genetic Neural Network von Zhang, Jinxia, Chang, Zhenjia, Niu, Fusheng, Zhang, Hongmei, Bu, Ziheng, Zheng, Kailu, Ma, Xianyun

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Efficient and reversible Cas13d-mediated knockdown with an all-in-one lentivirus-vector von Lv, Suli, Zhao, Xuefeng, Ma, Xianyun, Zou, Qingli, Li, Neng, Yan, Yingying, Sun, Lidong, Song, Tanjing

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TRIM28 represses renal cell carcinoma cell proliferation by inhibiting TFE3/KDM6A-regulated autophagy von Song, Tanjing, Lv, Suli, Ma, Xianyun, Zhao, Xuefeng, Fan, Li, Zou, Qingli, Li, Neng, Yan, Yingying, Zhang, Wen, Sun, Lidong

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Lysine demethylase KDM1A promotes cell growth via FKBP8-BCL2 axis in hepatocellular carcinoma von Lv, Suli, Zhao, Xuefeng, Zhang, Erlei, Yan, Yingying, Ma, Xianyun, Li, Neng, Zou, Qingli, Sun, Lidong, Song, Tanjing

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A method to determine superscrew dislocation structure in silicon carbide von Ma, Xianyun

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TFE3–SLC36A1 axis promotes resistance to glucose starvation in kidney cancer cells von Lv, Suli, Zhang, Zongbiao, Li, Zhenyong, Ke, Qian, Ma, Xianyun, Li, Neng, Zhao, Xuefeng, Zou, Qingli, Sun, Lidong, Song, Tanjing

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Investigation on barrier inhomogeneities in 4H-SiC Schottky rectifiers von Ma, Xianyun, Sadagopan, Priyamvada, Sudarshan, Tangali S.

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Versatile functions of RNA m6A machinery on chromatin von Song, Tanjing, Lv, Suli, Li, Neng, Zhao, Xuefeng, Ma, Xianyun, Yan, Yingying, Wang, Weixia, Sun, Lidong

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Nondestructive defect delineation in SiC wafers based on an optical stress technique von Ma, Xianyun, Parker, Mathew, Sudarshan, Tangali S.

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Extended SiC Defects: Polarized Light Microscopy Delineation and Synchrotron White-Beam X-Ray Topography Ratification von Ma, Xianyun, Dudley, Michael, Vetter, William, Sudarshan, Tangali

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Nondestructive defect characterization of SiC substrates and epilayers von XIANYUN MA, SUDARSHAN, Tangali

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Investigation on small growth pits in 4H silicon carbide epilayers von Ma, Xianyun, Chang, Hsuehrong, Zhang, Qingchun, Sudarshan, Tangali

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A method to eliminate birefringence of a magneto-optic AC current transducer with glass ring sensor head von Ma, Xianyun, Luo, Chengmu

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Superscrew dislocations in silicon carbide: Dissociation, aggregation, and formation von Ma, Xianyun

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A nondestructive automated defect detection system for silicon carbide wafers von Kubota, Toshiro, Talekar, Parag, Ma, Xianyun, Sudarshan, Tangali S.

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Analysis of Carbon Emissions of Prefabricated Buildings from the Views of Energy Conservation and Emission Reduction von Ma, Weidong, Sun, Dacheng, Deng, Yongsheng, Meng, Xianyun, Li, Mi

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EpiEL provides advanced optical characterization for nitride LED epi-wafers von Ma, Max Xianyun, Jia, Helen Jinghong

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Method and apparatus for nondestructively evaluating light-emitting materials von Ma, Xianyun

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Non-Destructive SiC Wafer Evaluation Based on an Optical Stress Technique von Sudarshan, Tangali S., Parker, Mathew, Ma, Xian Yun, Ma, Yuefei, Kubota, T.

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