Proton nonionizing energy loss (NIEL) for device applications von Insoo Jun, Xapsos, M.A., Messenger, S.R., Burke, E.A., Walters, R.J., Summers, G.P., Jordan, T.

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Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM von Heidel, D.F., Marshall, P.W., LaBel, K.A., Schwank, J.R., Rodbell, K.P., Hakey, M.C., Berg, M.D., Dodd, P.E., Friendlich, M.R., Phan, A.D., Seidleck, C.M., Shaneyfelt, M.R., Xapsos, M.A.

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Solar particle event storm shelter requirements for missions beyond low Earth orbit von Townsend, L.W., Adams, J.H., Blattnig, S.R., Clowdsley, M.S., Fry, D.J., Jun, I., McLeod, C.D., Minow, J.I., Moore, D.F., Norbury, J.W., Norman, R.B., Reames, D.V., Schwadron, N.A., Semones, E.J., Singleterry, R.C., Slaba, T.C., Werneth, C.M., Xapsos, M.A.

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Model for Cumulative Solar Heavy Ion Energy and Linear Energy Transfer Spectra von Xapsos, M.A., Stauffer, C., Jordan, T., Barth, J.L., Mewaldt, R.A.

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Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection von Black, J.D., Ball, D.R., Robinson, W.H., Fleetwood, D.M., Schrimpf, R.D., Reed, R.A., Black, D.A., Warren, K.M., Tipton, A.D., Dodd, P.E., Haddad, N.F., Xapsos, M.A., Kim, H.S., Friendlich, M.

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NIEL for heavy ions: an analytical approach von Messenger, S.R., Burke, E.A., Xapsos, M.A., Summers, G.P., Walters, R.J., Insoo Jun, Jordan, T.

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Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs von Tipton, A.D., Pellish, J.A., Hutson, J.M., Baumann, R., Deng, X., Marshall, A., Xapsos, M.A., Kim, H.S., Friendlich, M.R., Campola, M.J., Seidleck, C.M., LaBel, K.A., Mendenhall, M.H., Reed, R.A., Schrimpf, R.D., Weller, R.A., Black, J.D.

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Probability model for cumulative solar proton event fluences von Xapsos, M.A., Summers, G.P., Barth, J.L., Stassinopoulos, E.G., Burke, E.A.

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Solar Particle Events and Self-Organized Criticality: Are Deterministic Predictions of Events Possible? von Xapsos, M.A., Stauffer, C., Barth, J.L., Burke, E.A.

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Characterizing solar proton energy spectra for radiation effects applications von Xapsos, M.A., Barth, J.L., Stassinopoulos, E.G., Messenger, S.R., Walters, R.J., Summers, G.P., Burke, E.A.

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Model for solar proton risk assessment von Xapsos, M.A., Stauffer, C., Gee, G.B., Barth, J.L., Stassinopoulos, E.G., McGuire, R.E.

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Alpha particle nonionizing energy loss (NIEL) von Insoo Jun, Xapsos, M.A., Burke, E.A.

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Evidence for Lateral Angle Effect on Single-Event Latchup in 65 nm SRAMs von Hutson, J.M., Pellish, J.A., Tipton, A.D., Boselli, G., Xapsos, M.A., Kim, H., Friendlich, M., Campola, M., Seidleck, S., LaBel, K., Marshall, A., Deng, X., Baumann, R., Reed, R.A., Schrimpf, R.D., Weller, R.A., Massengill, L.W.

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Inclusion of Radiation Environment Variability in Total Dose Hardness Assurance Methodology von Xapsos, M. A., Stauffer, C., Phan, A., McClure, S. S., Ladbury, R. L., Pellish, J. A., Campola, M. J., LaBel, K. A.

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Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions von Sierawski, B.D., Pellish, J.A., Reed, R.A., Schrimpf, R.D., Warren, K.M., Weller, R.A., Mendenhall, M.H., Black, J.D., Tipton, A.D., Xapsos, M.A., Baumann, R.C., Xiaowei Deng, Campola, M.J., Friendlich, M.R., Kim, H.S., Phan, A.M., Seidleck, C.M.

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NIEL calculations for high-energy heavy ions von Xapsos, M.A., Burke, E.A., Badavi, F.F., Townsend, L.W., Wilson, J.W., Jun, I.

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The Simulation of damage tracks in silicon von Messenger, S.R., Burke, E.A., Xapsos, M.A., Summers, G.P., Walters, R.J.

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NIEL and damage correlations for high-energy protons in gallium arsenide devices von Messenger, S.R., Walters, R.J., Burke, E.A., Summers, G.P., Xapsos, M.A.

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Probabilistic model for low-altitude trapped-proton fluxes von Xapsos, M.A., Huston, S.L., Barth, J.L., Stassinopoulos, E.G.

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2001 special nuclear and space radiation effects conference (NSREC) issue of the IEEE Transactions on Nuclear Science [Guest Editorial] von Xapsos, M.A.

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