New ballasting method for MOS output drivers and power bus clamps von Worley, E.R.

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Diode with variable width metal stripes for improved protection against electrostatic discharge (ESD) current failure von M. MATLOUBIAN, E.R. WORLEY

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Correction to "On the characteristic of the deep-depletion SOS transistor" von Worley, E.R.

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SOI transistor measurement techniques using body contacted transistors von Worley, E.R., Williams, R.

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Weak inversion characteristics of the fully depleted SOS MOSFET von Worley, E.R.

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Accuracy of channel resistance and current gain methods of L/sub eff/ extraction von Bhattacharya, S.S., Worley, E.R., Williams, R.A.

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Sub-micron chip ESD protection schemes which avoid avalanching junctions von Worley, E.R., Gupta, R., Jones, B., Kjar, R., Nguyen, C., Tennyson, M.

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On the characteristic of the deep-depletion SOS transistor von Worley, E.R.

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Performance of carry lookahead generator circuit fabricated with gallium arsenide von Sato, R.N., Sokolich, M., Le, H.M., Yang, H.T., Levy, H.M., Worley, E.R.

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Ultra low impedance transmission line tester von Chu, C.Y., Worley, E.R.

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No association between the APOE gene and autism von Raiford, K.L., Shao, Y., Allen, I.C., Martin, E.R., Menold, M.M., Wright, H.H., Abramson, R.K., Worley, G., DeLong, G.R., Vance, J.M., Cuccaro, M.L., Gilbert, J.R., Pericak-Vance, M.A.

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