Measurement and analysis of neutron-induced soft errors in sub-half-micron CMOS circuits von Tosaka, Y., Satoh, S., Itakura, T., Ehara, H., Ueda, T., Woffinden, G.A., Wender, S.A.

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Cosmic ray neutron-induced soft errors in sub-half micron CMOS circuits von Tosaka, Y., Satoh, S., Itakura, T., Suzuki, K., Sugii, T., Ehara, H., Woffinden, G.A.

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Measurements and analysis of neutron-reaction-induced charges in a silicon surface region von Tosaka, Y., Satoh, S., Suzuki, K., Sugii, T., Nakayama, N., Ehara, H., Woffinden, G.A., Wender, S.A.

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Impact of cosmic ray neutron induced soft errors on advanced submicron CMOS circuits von Tosaka, Y., Satoh, S., Suzuki, K., Sugii, T., Ehara, H., Woffinden, G.A., Wender, S.A.

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Comparison and implications of charge collection measurements in silicon and InGaAs irradiated by energetic protons and neutrons von Normand, E., Oberg, D.L., Wert, J.L., Majewski, P.P., Woffinden, G.A., Satoh, S., Sasaki, K., Tverskoy, M.G., Miroshkin, V.V., Goleminov, N., Wender, S.A., Gavron, A.

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