Microprobe x-ray fluorescence with the use of point-focusing diffractors von Chen, Z. W., Wittry, D. B.

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Spatial distribution of excess carriers in electron-beam excited semiconductors von Kyser, D.F., Wittry, D.B.

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Determination of grain-boundary parameters of polycrystalline silicon by ac electron-beam-induced current von ROMANOWSKI, A, WITTRY, D. B

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Measurement of carrier lifetime, effective recombination velocity, and diffusion length near the grain boundary using the time-dependent electron-beam-induced current von ROMANOWSKI, A, WITTRY, D. B

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X-ray continuum from thick elemental targets for 10–50-keV electrons von Rao-Sahib, T. S., Wittry, D. B.

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Analysis of the short-circuit current of a polycrystalline solar cell with excitation by a gated electron beam von ROMANOWSKI, A, WITTRY, D. B, TSAUR, J. M

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Study of the thermal conversion of semi-insulating GaAs: Cr with cathodoluminescence, photoluminescence, and secondary ion mass spectrometry von YIN, S. Y, WITTRY, D. B

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Use of coincidence techniques to improve the detection limits of electron spectroscopy in stem von Wittry, D.B.

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A simplified hybrid detector for ion counting von Wittry, D B, Guo, F

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Use of Electron Probes in the Study of Recombination Radiation von Wittry, David B., Kyser, David F.

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Cathodoluminescence study of plastically deformed GaAs von Esquivel, A.L., Lin, W.N., Wittry, D.B.

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