Analysis and modeling of on-chip high-voltage generator circuits for use in EEPROM circuits von Witters, J.S., Groeseneken, G., Maes, H.E.

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Degradation of tunnel-oxide floating-gate EEPROM devices and the correlation with high field-current-induced degradation of thin gate oxides von Witters, J.S., Groeseneken, G., Maes, H.E.

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A modular BICMOS technology includilng 85V DMOS devices for analogue/digital ASIC applications von Witters, J.S.

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A modular BICMOS technology including 85V DMOS devices for analogue/digital ASIC applications von Witters, J.S.

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Degradation phenomena of tunnel oxide floating gate EEPROM devices von Witters, J.S., Groeseneken, G., Maes, H.E.

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Study of the enhanced hot-electron injection in split-gate transistor structures von Van Houdt, J., Heremans, P., Witters, J.S., Groeseneken, G., Maes, H.E.

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