High-Performance TiO2-Based Electron-Selective Contacts for Crystalline Silicon Solar Cells von Yang, Xinbo, Bi, Qunyu, Ali, Haider, Davis, Kristopher, Schoenfeld, Winston V., Weber, Klaus

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Tin gallium oxide solar-blind photodetectors on sapphire grown by molecular beam epitaxy von Mukhopadhyay, Partha, Schoenfeld, Winston V

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Solar blind photodetector based on epitaxial zinc doped Ga2O3 thin film von Alema, Fikadu, Hertog, Brian, Ledyaev, Oleg, Volovik, Dmitry, Thoma, Grant, Miller, Ross, Osinsky, Andrei, Mukhopadhyay, Partha, Bakhshi, Sara, Ali, Haider, Schoenfeld, Winston V.

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Epitaxial growth of Co3O4 thin films using Co(dpm)3 by MOCVD von Alema, Fikadu, Osinsky, Andrei, Mukhopadhyay, Partha, Schoenfeld, Winston V.

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High-Performance HfO2/Al2O3 Superlattice MIM Capacitor in a 200 mm High-Volume Batch-ALD Platform von Mukhopadhyay, Partha, Fletcher, Ivan, Couvertier, Zuriel C., Morris, Julio, Perez, Jennifer, Nichols, Chris, Allgair, John, Vandevere, Jim, Schoenfeld, Winston V., Aoki, Sara, Novoselic, Enzo, Lombardo, Shara, Triyoso, Dina, Kretzschmar, Jon, deVilliers, Anton, Fulford, Jim

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Growth of high Mg content wurtzite MgZnO epitaxial films via pulsed metal organic chemical vapor deposition von Alema, Fikadu, Ledyaev, Oleg, Miller, Ross, Beletsky, Valeria, Osinsky, Andrei, Schoenfeld, Winston V.

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Simple and versatile UV-ozone oxide for silicon solar cell applications von Bakhshi, Sara, Zin, Ngwe, Ali, Haider, Wilson, Marshall, Chanda, Debashis, Davis, Kristopher O., Schoenfeld, Winston V.

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Solar blind Schottky photodiode based on an MOCVD-grown homoepitaxial β-Ga2O3 thin film von Alema, Fikadu, Hertog, Brian, Mukhopadhyay, Partha, Zhang, Yuewei, Mauze, Akhil, Osinsky, Andrei, Schoenfeld, Winston V., Speck, James S., Vogt, Timothy

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Manufacturing metrology for c-Si module reliability and durability Part III: Module manufacturing von Schneller, Eric J., Brooker, R. Paul, Shiradkar, Narendra S., Rodgers, Marianne P., Dhere, Neelkanth G., Davis, Kristopher O., Seigneur, Hubert P., Mohajeri, Nahid, Wohlgemuth, John, Scardera, Giuseppe, Rudack, Andrew C., Schoenfeld, Winston V.

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Spatial Atomic Layer Deposition of Aluminum Oxide as a Passivating Hole Contact for Silicon Solar Cells von Öğütman, Kortan, Iqbal, Nafis, Gregory, Geoffrey, Li, Mengjie, Haslinger, Michael, Cornagliotti, Emanuele, Schoenfeld, Winston V., John, Joachim, Davis, Kristopher O.

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Role of defects in ultra-high gain in fast planar tin gallium oxide UV-C photodetector by MBE von Mukhopadhyay, Partha, Hatipoglu, Isa, Frodason, Ymir K., Varley, Joel B., Williams, Martin S., Hunter, Daniel A., Gunasekar, Naresh K., Edwards, Paul R., Martin, Robert W., Wu, Feng, Mauze, Akhil, Speck, James S., Schoenfeld, Winston V.

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Transmission Electron Microscopy Studies of Electron-Selective Titanium Oxide Contacts in Silicon Solar Cells von Ali, Haider, Yang, Xinbo, Weber, Klaus, Schoenfeld, Winston V., Davis, Kristopher O.

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Tin Gallium Oxide Epilayers on Different Substrates: Optical and Compositional Analysis von Hunter, Daniel. A., Naresh‐Kumar, Gunasekar, Edwards, Paul R., Makydonska, Olha, Massabuau, Fabien C. P., Hatipoglu, Isa, Mukhopadhyay, Partha, Schoenfeld, Winston V., Martin, Robert W.

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Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy Studies of Hole-Selective Molybdenum Oxide Contacts in Silicon Solar Cells von Ali, Haider, Maynau, Céline, Lajaunie, Luc, Gregory, Geoffrey, Wu, Lijun, Looney, John Patrick, Zhu, Yimei, Schneider, Matthew, Schoenfeld, Winston V, Davis, Kristopher O

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Transmission electron microscopy based interface analysis of the origin of the variation in surface recombination of silicon for different surface preparation methods and passivati... von Ali, Haider, Moldovan, Anamaria, Mack, Sebastian, Schoenfeld, Winston V., Davis, Kristopher O.

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Manufacturing metrology for c-Si module reliability and durability Part II: Cell manufacturing von Davis, Kristopher O., Rodgers, Marianne P., Scardera, Giuseppe, Brooker, R. Paul, Seigneur, Hubert, Mohajeri, Nahid, Dhere, Neelkanth G., Wohlgemuth, John, Schneller, Eric, Shiradkar, Narendra, Rudack, Andrew C., Schoenfeld, Winston V.

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Manufacturing metrology for c-Si photovoltaic module reliability and durability, Part I: Feedstock, crystallization and wafering von Seigneur, Hubert, Mohajeri, Nahid, Brooker, R. Paul, Davis, Kristopher O., Schneller, Eric J., Dhere, Neelkanth G., Rodgers, Marianne P., Wohlgemuth, John, Shiradkar, Narendra S., Scardera, Giuseppe, Rudack, Andrew C., Schoenfeld, Winston V.

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Automated detection of rear contact voids in perc cells with photoluminescence imaging von Öğütman, Kortan, Davis, Kristopher O., Ali, Haider, Martell, Steven R., Schoenfeld, Winston V.

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Integration of spatially resolved ideality factor into local cell efficiency analysis with photoluminescence von Öğütman, Kortan, Davis, Kristopher O., Schneller, Eric, Yelundur, Vijay, Schoenfeld, Winston V.

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Effective Use of UV‐Ozone Oxide in Silicon Solar Cell Applications von Zin, Ngwe, Bakhshi, Sara, Gao, Munan, Ali, Haider, Kashkoush, Ismail, Schoenfeld, Winston V.

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