Power semiconductors empirical diagrams expressing life as a function of temperature excursion von Somos, I.L., Piccone, D.E., Willinger, L.J., Tobin, W.H.

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Power semiconductors-a new method for predicting the on-state characteristic and temperature rise during multicycle fault currents von Somos, I.L., Piccone, D.E., Willinger, L.J., Tobin, W.H.

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Design and testing of high power, repetitively pulsed, solid-state closing switches von Boenig, H.J., Schwartzenberg, J.W., Willinger, L.J., Piccone, D.E., Lopez, D.A., Smolleck, H.A.

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Power semiconductor devices-examination of subcycle surge current ratings as needed for fuse selection von Eriksson, L.O., Piccone, D.E., Willinger, L.J., Tobin, W.H.

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Power semiconductors-a new method for predicting the on-state characteristic and temperature rise during multi-cycle fault currents von Somos, I.L., Piccone, D.E., Willinger, L.J., Tobin, W.H.

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Selecting fuses for power semiconductor devices von Eriksson, L.O., Piccone, D.E., Willinger, L.J., Tobin, W.H.

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De Gids. Jaargang 133 von [tijdschrift] Gids, De

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