A study of the chemical and physical effects of ion implantation of micro-porous and nonporous PTFE von Colwell, J.M., Wentrup-Byrne, E., Bell, J.M., Wielunski, L.S.

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Precision determination of the density of a single crystal silicon sphere and evaluation of the Avogadro constant von Kenny, M.J., Leistner, A.J., Walsh, C.J., Fen, K., Giardini, W.J., Wielunski, L.S., Netterfield, R.P., Ward, B.R.

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In situ infrared spectroscopy of hafnium oxide growth on hydrogen-terminated silicon surfaces by atomic layer deposition von Ho, M.-T., Wang, Y., Brewer, R. T., Wielunski, L. S., Chabal, Y. J., Moumen, N., Boleslawski, M.

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Characterization of mechanical properties of VO2 thin films on sapphire and silicon by ultra-microindentation von Jin, P., Nakao, S., Tanemura, S., Bell, T., Wielunski, L.S., Swain, M.V.

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Mechanical and structural modification of CR-39 polymer surface by 50-keV hydrogen and argon ion implantation von Wielunski, L.S., Clissold, R.A., Yap, E., McCulloch, D.G., McKenzie, D.R., Swain, M.V.

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Multiple and double scattering contributions to depth resolution and low energy background in hydrogen elastic recoil detection von Wielunski, L.S.

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Theoretical approximation of energy distribution of elastically recoiled hydrogen atoms von Szilágyi, E., Wielunski, L.S., Pászti, F.

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Application of 14N( 3He, 4He) 13N nuclear reaction to nitrogen depth profiling in metals von Wielunski, L.S.

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Hydrogen depth resolution in multilayer metal structures, comparison of elastic recoil detection and resonant nuclear reaction method von Wielunski, L.S., Grambole, D., Kreissig, U., Grötzschel, R., Harding, G., Szilágyi, E.

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Low temperature MOCVD of Hg1−xCdxTe on 311, 511, 711 and shaped GaAs von Pain, G.N., Sandford, C., Smith, G.K.G., Stevenson, A.W., Gao, D., Wielunski, L.S., Russo, S.P., Reeves, G.K., Elliman, R.

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Polarity determination of epitaxial structures of CdTe on GaAs by channeling techniques von Wielunski, L.S., Kwietniak, M.S., Pain, G.N., Rossouw, C.J.

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Production of Si + and Cl + ion beams from a Freeman type ion source using low toxicity and non-corrosive vapours as source gas von Wielunski, L.S., Paterson, G.D., Bell, J.M., Clegg, R.E.

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High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures von Osipowicz, T., Seng, H.L., Wielunski, L.S., Tok, E.S., Breton, G., Zhang, J.

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Detection of submonolayer 18O on a gold surface by nuclear reaction analysis von Wielunski, L.S., Wieczorek, L.

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Optimal geometry for GeSi/Si super-lattice structure RBS investigation von Wielunski, L.S., Osipowicz, T., Teo, E.J., Watt, F., Tok, E.S., Zhang, J.

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Measurement of the micro mechanical properties of sol-gel TiO 2 films von Jämting, Å.K., Bell, J.M., Swain, M.V., Wielunski, L.S., Clissold, R.

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Depth profiling of nitrogen implanted into Si/C and Zr/C bilayers with nuclear reaction analysis von Miyagawa, Y, Nakao, S, Wielunski, L.S, Hasegawa, H, Miyagawa, S

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Simultaneous hydrogen detection with an ERD gas ionization detector von Elliman, R.G, Timmers, H, Ophel, T.R, Weijers, T.D.M, Wielunski, L.S, Harding, G.L

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Surface layer impurities on silicon spheres used in determination of the Avogadro constant von Kenny, M.J., Netterfield, R.P., Wielunski, L.S., Beaglehole, D.

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Characterization of mechanical properties of VO 2 thin films on sapphire and silicon by ultra-microindentation von Jin, P., Nakao, S., Tanemura, S., Bell, T., Wielunski, L.S., Swain, M.V.

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