Treffer 1 - 2 von 2 für Suche 'Wi, Taewook', Suchdauer: 0,51s Treffer weiter einschränken
  1. 1
    D2-SPDM: Faster R-CNN-Based Defect Detection and Surface Pixel Defect Mapping with Label Enhancement in Steel Manufacturing Processes

    D2-SPDM: Faster R-CNN-Based Defect Detection and Surface Pixel Defect Mapping with Label Enhancement in Steel Manufacturing Processes von Wi, Taewook, Yang, Minyeol, Park, Suyeon, Jeong, Jongpil

    Veröffentlicht in Applied sciences

    Volltext
    Artikel

    Zu den Favoriten
    Gespeichert in:
  2. 2
    D[sup.2]-SPDM: Faster R-CNN-Based Defect Detection and Surface Pixel Defect Mapping with Label Enhancement in Steel Manufacturing Processes

    D[sup.2]-SPDM: Faster R-CNN-Based Defect Detection and Surface Pixel Defect Mapping with Label Enhancement in Steel Manufacturing Processes von Wi, Taewook, Yang, Minyeol, Park, Suyeon, Jeong, Jongpil

    Veröffentlicht in Applied sciences

    Volltext
    Artikel

    Zu den Favoriten
    Gespeichert in:

Suchwerkzeuge: