Thermal stability and structural characteristics of HfO2 films on Si (100) grown by atomic-layer deposition von Cho, M.-H., Roh, Y. S., Whang, C. N., Jeong, K., Nahm, S. W., Ko, D.-H., Lee, J. H., Lee, N. I., Fujihara, K.

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Influence of postannealing on polycrystalline pentacene thin film transistor von Kang, S. J., Noh, M., Park, D. S., Kim, H. J., Whang, C. N., Chang, C.-H.

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Optical and luminescence characteristics of thermally evaporated pentacene films on Si von Park, S. P., Kim, S. S., Kim, J. H., Whang, C. N., Im, S.

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Dielectric characteristics of Al2O3–HfO2 nanolaminates on Si(100) von Cho, M.-H., Roh, Y. S., Whang, C. N., Jeong, K., Choi, H. J., Nam, S. W., Ko, D.-H., Lee, J. H., Lee, N. I., Fujihara, K.

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Probing Interfacial Characteristics of Rubrene/Pentacene and Pentacene/Rubrene Bilayers with Soft X-Ray Spectroscopy von Seo, J. H, Pedersen, T. M, Chang, G. S, Moewes, A, Yoo, K.-H, Cho, S. J, Whang, C. N

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Thermal Oxidation Study on Lead-free Solders of Sn-Ag-Cu and Sn-Ag-Cu-Ge von Wan Cho, S., Han, K., Yi, Y., Kang, S. J., Yoo, K.-H., Jeong, K., Whang, C.-N.

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Electronic structure of perylene on Au studied by ultraviolet photoelectron spectroscopy and density functional theory von Kang, S.J., Yi, Y., Cho, K., Jeong, K., Yoo, K.-H., Whang, C.N.

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Electronic structure of NPB and BCP molecules probed by x-ray emission spectroscopy von Seo, J. H., Kim, C. Y., Kang, S. J., Yoo, K.-H., Whang, C. N., Moewes, A., Chang, G. S.

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Electronic structure of pentacene/ultrathin gate dielectric interfaces for low-voltage organic thin film transistors von Cho, S. W., Park, D. S., Jang, W. C., Cho, M.-H., Yoo, K.-H., Jeong, K., Whang, C.-N., Yi, Y., Chung, K. B.

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Fabrication and characterization of the pentacene thin film transistor with a Gd2O3 gate insulator von KANG, S. J, CHUNG, K. B, PARK, D. S, KIM, H. J, CHOI, Y. K, JANG, M. H, NOH, M, WHANG, C. N

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The influence of thin insulating lithium fluoride inserted pentacene layer on pentacene-based organic thin-film transistor von Park, D.S., Jeong, I.S., Kim, C.Y., Jang, W.C., Jeong, K., Yoo, K.-H., Whang, C.N., Lee, Y.S., Kim, S.O.

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Uniaxial in-plane magnetic anisotropy of a CoPt thin film induced by ion irradiation von Chang, G. S., Moewes, A., Kim, S. H., Lee, J., Jeong, K., Whang, C. N., Kim, D. H., Shin, S.-C.

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Sum-Frequency Vibrational Spectroscopic Study of Polyimide Surfaces Made by Spin Coating and Ionized Cluster Beam Deposition von Sung, Jaeho, Kim, Doseok, Whang, C. N, Oh-e, Masahito, Yokoyama, Hiroshi

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Origin of charge transfer complex resulting in ohmic contact at the C60/Cu interface von CHO, S. W, YI, Y, SEO, J. H, KIM, C. Y, NOH, M, YOO, K.-H, JEONG, K, WHANG, C.-N

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Electroluminescence mechanism in SiOx layers containing radiative centers von Bae, H. S., Kim, T. G., Whang, C. N., Im, S., Yun, J. S., Song, J. H.

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Characterization of iridium film as a stimulating neural electrode von Lee, In-Seop, Whang, Chung-Nam, Choi, Kyung, Choo, Myung-Soo, Lee, Young-Hee

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Surface-induced phase separation in Pd–Ag alloy: the case opposite to surface alloying von Choi, I S, Whang, C N, Hwang, Chanyong

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Photoresponse of Si detector based on n-ZnO/p-Si and n-ZnO/n-Si structures von Kim, H.Y., Kim, J.H., Kim, Y.J., Chae, K.H., Whang, C.N., Song, J.H., Im, S.

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Energy level alignment of C60/Co using x-ray and UV photoelectron spectroscopy von Seo, J H, Kang, S J, Kim, C Y, Yoo, K-H, Whang, C N

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Interface study of ion irradiated Cu/Ni/Cu(0 0 2)/Si magnetic thin film by X-ray reflectivity von Kim, T.G., Lee, J.H., Song, J.H., Chae, K.H., Shin, S.W., Hwang, H.M., Lee, J., Jeong, K., Whang, C.N., Lee, J.-S., Lee, K.-B.

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