The influence of Cu/Li ratio on precipitation in Al–Cu–Li–x alloys von Decreus, B., Deschamps, A., De Geuser, F., Donnadieu, P., Sigli, C., Weyland, M.

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The influence of precipitation on plastic deformation of Al–Cu–Li alloys von Deschamps, A., Decreus, B., De Geuser, F., Dorin, T., Weyland, M.

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The effect of interrupted aging on the yield strength and uniform elongation of precipitation-hardened Al alloys von Chen, Y., Weyland, M., Hutchinson, C.R.

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Direct Measurements of Collisional Dynamics in Cold Atom Triads von Reynolds, L. A., Schwartz, E., Ebling, U., Weyland, M., Brand, J., Andersen, M. F.

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Structure Retrieval at Atomic Resolution in the Presence of Multiple Scattering of the Electron Probe von Brown, H G, Chen, Z, Weyland, M, Ophus, C, Ciston, J, Allen, L J, Findlay, S D

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On the strain accommodation of β1 precipitates in magnesium alloy WE54 von Xu, Z., Weyland, M., Nie, J.F.

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The effect of precipitate size on the yield strength-pitting corrosion correlation in Al–Cu–Mg alloys von Ralston, K.D., Birbilis, N., Weyland, M., Hutchinson, C.R.

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3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography von Midgley, P.A., Weyland, M.

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The building block of long-period structures in Mg–RE–Zn alloys von Zhu, Y.M., Weyland, M., Morton, A.J., Oh-ishi, K., Hono, K., Nie, J.F.

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Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy von Chen, Z., Weyland, M., Sang, X., Xu, W., Dycus, J.H., LeBeau, J.M., D'Alfonso, A.J., Allen, L.J., Findlay, S.D.

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Shear transformation of coupled β1/β' precipitates in Mg―RE alloys: A quantitative study by aberration corrected STEM von XU, Z, WEYLAND, M, NIE, J. F

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A microcontroller based self-locking laser system von Ruksasakchai, P., Cowdell, C. E., Sanchez, L., Weyland, M., Andersen, M. F.

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Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector von Mawson, T., Taplin, D.J., Brown, H.G., Clark, L., Ishikawa, R., Seki, T., Ikuhara, Y., Shibata, N., Paganin, D.M., Morgan, M.J., Weyland, M., Petersen, T.C., Findlay, S.D.

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Characterization of planar features in Mg–Y–Zn alloys von Zhu, Y.M., Morton, A.J., Weyland, M., Nie, J.F.

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Pair Correlations and Photoassociation Dynamics of Two Atoms in an Optical Tweezer von Weyland, M., Szigeti, S. S., Hobbs, R. A. B., Ruksasakchai, P., Sanchez, L., Andersen, M. F.

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Energy dispersive X-ray analysis on an absolute scale in scanning transmission electron microscopy von Chen, Z., D'Alfonso, A.J., Weyland, M., Taplin, D.J., Allen, L.J., Findlay, S.D.

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Practical aspects of diffractive imaging using an atomic-scale coherent electron probe von Chen, Z., Weyland, M., Ercius, P., Ciston, J., Zheng, C., Fuhrer, M.S., D'Alfonso, A.J., Allen, L.J., Findlay, S.D.

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Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopy von Chen, Z., Taplin, D.J., Weyland, M., Allen, L.J., Findlay, S.D.

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Role of nanostructure in pitting of Al–Cu–Mg alloys von Ralston, K.D., Birbilis, N., Cavanaugh, M.K., Weyland, M., Muddle, B.C., Marceau, R.K.W.

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Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metric von Pollock, J.A., Weyland, M., Taplin, D.J., Allen, L.J., Findlay, S.D.

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