Tribological properties of additives for water-based lubricants von Tomala, A., Karpinska, A., Werner, W.S.M., Olver, A., Störi, H.

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Coherence in electron energy loss spectrometry von Schattschneider, P., Werner, W.S.M.

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Simulation of electron spectra for surface analysis (SESSA): a novel software tool for quantitative Auger-electron spectroscopy and X-ray photoelectron spectroscopy von Smekal, Werner, Werner, Wolfgang S. M., Powell, Cedric J.

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Surface excitations in electron spectroscopy. Part I: dielectric formalism and Monte Carlo algorithm von Salvat-Pujol, F., Werner, W. S. M.

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Electron transport in solids for quantitative surface analysis von Werner, Wolfgang S. M.

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Differential probability for surface and volume electronic excitations in Fe, Pd and Pt von Werner, Wolfgang S.M.

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Numerical approximation of AR-XPS spectra for rough surfaces considering the effect of electron shadowing von Bianchi, D., Katona, L., Brenner, J., Vorlaufer, G., Vernes, A., Werner, W. S. M.

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Interlaboratory study comparing analyses of simulated angle-resolved X-ray photoelectron spectroscopy data von Tasneem, G., Werner, W. S. M., Smekal, W., Powell, C. J.

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Effective attenuation lengths for photoelectrons in thin films of silicon oxynitride and hafnium oxynitride on silicon von Powell, C. J., Werner, W. S. M., Smekal, W., Tasneem, G.

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Trajectory reversal approach for electron backscattering from solid surfaces von WERNER, Wolfgang S. M

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Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS von Belsey, NA, Cant, DJH, Minelli, C, Araujo, JR, Brock, B, Bruener, P, Castner, DG, Ceccone, G, Counsell, JDP, Dietrich, PM, Engelhard, MH, Fearn, S, Galhardo, CE, Kalbe, H, Kim, JW, Lartunda-Rojas, L, Luftman, HS, Nunney, TS, Pseiner, J, Smith, EF, Sturm, M, Spampinato, V, Thomas, AG, Treacy, JPW, Veith, L, Wagstaffe, M, Wang, H, Wang, M, Wang, YC, Werner, WSM, Yang, L, Shard, AG

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Emission-depth-selective auger photoelectron coincidence spectroscopy von WERNER, Wolfgang S. M, SMEKAL, Werner, STÖRI, Herbert, WINTER, Hannspeter, STEFANI, Giovanni, RUOCCO, Alessandro, OFFI, Francesco, GOTTER, Roberto, MORGANTE, Alberto, TOMMASINI, Fernando

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Surface excitation probability of medium energy electrons in metals and semiconductors von Werner, Wolfgang S.M., Smekal, Werner, Tomastik, Christian, Störi, Herbert

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Surface and bulk plasmon coupling observed in reflection electron energy loss spectra von Werner, Wolfgang S.M.

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Angular-resolved photoelectron spectroscopy of corrugated surfaces von Olejnik, K., Zemek, J., Werner, W.S.M.

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Reflection electron energy loss spectroscopy of aluminum von Jiricek, P., Bartos, I., Zemek, J., Werner, W.S.M.

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Simulation of electron spectra for surface analysis using the partial-intensity approach (PIA) von Werner, Wolfgang S. M.

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Measurement of the surface excitation probability of medium energy electrons reflected from Si, Ni, Ge and Ag surfaces von Werner, Wolfgang S.M., Kövér, Lászlo, Egri, Sándor, Tóth, József, Varga, Desző

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Obtaining quantitative information on surface excitations from reflection electron energy-loss spectroscopy (REELS) von Werner, Wolfgang S. M.

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Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy von Powell, C.J., Jablonski, A., Werner, W.S.M., Smekal, W.

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