Nanoscale Imaging of Light-Matter Coupling Inside Metal-Coated Cavities with a Pulsed Electron Beam von Moerland, Robert J, Weppelman, I. Gerward C, Scotuzzi, Marijke, Hoogenboom, Jacob P

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Nanoparticle discrimination based on wavelength and lifetime-multiplexed cathodoluminescence microscopy von Garming, Mathijs W. H, Weppelman, I. Gerward C, de Boer, Pascal, Martínez, Felipe Perona, Schirhagl, Romana, Hoogenboom, Jacob P, Moerland, Robert J

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Confocal filtering in cathodoluminescence microscopy of nanostructures von Narváez, Angela C., Weppelman, I. Gerward C., Moerland, Robert J., Hoogenboom, Jacob P., Kruit, Pieter

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Time-resolved cathodoluminescence microscopy with sub-nanosecond beam blanking for direct evaluation of the local density of states von Moerland, Robert J, Weppelman, I Gerward C, Garming, Mathijs W H, Kruit, Pieter, Hoogenboom, Jacob P

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Cathodoluminescence Microscopy of nanostructures on glass substrates von Narváez, Angela C, Weppelman, I Gerward C, Moerland, Robert J, Liv, Nalan, Zonnevylle, A Christiaan, Kruit, Pieter, Hoogenboom, Jacob P

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Ultrafast scanning electron microscopy with sub-micrometer optical pump resolution von Garming, Mathijs W. H., Weppelman, I. Gerward C., Lee, Martin, Stavenga, Thijs, Hoogenboom, Jacob P.

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Ultrafast Laser-Pump Electron-Probe Microscopy for Imaging Semiconductor Carrier Dynamics von Garming, Mathijs W.H., Weppelman, I.G. (Gerward) C., Kruit, Pieter, Hoogenboom, Jacob P.

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