Study on processing step uniformity tuning during FET fabrication and sensor wafer response as a function of chuck temperature adjustment von Milenin, Alexey P., Boullart, Werner, Quli, Farhat, Wen, Youxian

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Weed/corn seedling recognition by support vector machine using texture features von Wu, Lanlu, Wen, Youxian

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Nondestructive detecting cracks of preserved eggshell using polarization technology and cluster analysis von Wang, Fang, Wen, Youxian, Tan, Zuojun, Cheng, Fei, Wei, Wei, Li, Zhi, Yi, Weisong

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Detecting Preserved Eggshell Crack Using Machine Vision von Wang Fang, Wen Youxian

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Application of support vector machine for identifying single corn/weed seedling in fields using shape parameters von Wu Lanlan, Wen Youxian

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Challenges and Opportunities for Optical CD Metrology in Future Lithography Process von Bao, Junwei, Ferns, Jason, Wen, Youxian

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Classification of Single Cereal Grain Kernel Using Shape Parameters Based on Machine Vision von Wu, Jie, Wen, You Xian, Xiong, Li Rong, Wu, Lan Lan, Zheng, Yu

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Edge Detection of Growing Citrus Based on Self-Adaptive Canny Operator von Peng Hui, Zhai Ruifang, Liu Shanmei, Wen Youxian, Wu Lanlan

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Detection for Corn/Weed Images Using Moment Invariants by BPNN Classifier von Wu, Jie, Zhu, Zhi Hui, Wu, Lan Lan, Peng, Hui, Wen, You Xian

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Stereo Matching for Binocular Citrus Images Using Surf Operator and Epipolar Constraint von Peng Hui, Zhai Ruifang, Liu Shanmei, Wen Youxian, Wu Lanlan

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COMBINED MODELING AND MACHINE LEARNING IN OPTICAL METROLOGY von Wen, Youxian, Attukur Nandagopal, Rajaram, Teh, Pei Fen

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COMBINED MODELING AND MACHINE LEARNING IN OPTICAL METROLOGY von WEN, Youxian, TEH, Pei Fen, ATTUKUR NANDAGOPAL, Rajaram

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System und Verfahren zur Inspektion und Metrologie von Halbleiterwafern von Wen, Youxian, Li, Shifang

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Nanosecond laser temperature-jump optical rotatory dispersion: Application to early events in protein folding/unfolding von Chen, Eefei, Wen, Youxian, Lewis, James W., Goldbeck, Robert A., Kliger, David S., Strauss, Charlie E. M.

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System and method for semiconductor wafer inspection and metrology von Wen Youxian, Li Shifang

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Eggshell Crack Detection by Acoustic Impulse Response and Support Vector Machine

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METROLOGY SOLUTIONS FOR COMPLEX STRUCTURES OF INTEREST von SHI, Jingsheng, WEN, Youxian, CHIEW, Wei Ming, LI, Jie, TEH, Pei Fen

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METROLOGY SOLUTIONS FOR COMPLEX STRUCTURES OF INTEREST von SHI, Jingsheng, WEN, Youxian, CHIEW, Wei Ming, LI, Jie, TEH, Pei Fen

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Design for system of intelligent robot detecting and grading eggs von WANG, Shucai

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Design for system of intelligent robot detecting and grading eggs von Wang, Shucai, Wen, Youxian, Su, Gongbing

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