Ge/SiGe Superlattices for Thermoelectric Devices Grown by Low-Energy Plasma-Enhanced Chemical Vapor Deposition von Cecchi, S., Etzelstorfer, T., Müller, E., Samarelli, A., Ferre Llin, L., Chrastina, D., Isella, G., Stangl, J., Weaver, J. M. R., Dobson, P., Paul, D. J.

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Thermal analysis of submicron nanocrystalline diamond films von Rossi, S., Alomari, M., Zhang, Y., Bychikhin, S., Pogany, D., Weaver, J.M.R., Kohn, E.

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Multilayered Ge/SiGe Material in Microfabricated Thermoelectric Modules von Samarelli, A., Llin, L. Ferre, Cecchi, S., Chrastina, D., Isella, G., Etzelstorfer, T., Stangl, J., Gubler, E. Muller, Weaver, J. M. R., Dobson, P., Paul, D. J.

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The thermoelectric properties of Ge/SiGe modulation doped superlattices von Samarelli, A., Ferre Llin, L., Cecchi, S., Frigerio, J., Etzelstorfer, T., Müller, E., Zhang, Y., Watling, J. R., Chrastina, D., Isella, G., Stangl, J., Hague, J. P., Weaver, J. M. R., Dobson, P., Paul, D. J.

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Thermal Conductivity Measurement Methods for SiGe Thermoelectric Materials von Llin, L. Ferre, Samarelli, A., Zhang, Y., Weaver, J. M. R., Dobson, P., Cecchi, S., Chrastina, D., Isella, G., Etzelstorfer, T., Stangl, J., Gubler, E. Muller, Paul, D. J.

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Power Factor Characterization of Ge/SiGe Thermoelectric Superlattices at 300 K von Samarelli, A., Llin, L. Ferre, Zhang, Y., Weaver, J. M. R., Dobson, P., Cecchi, S., Chrastina, D., Isella, G., Etzelstorfer, T., Stangl, J., Gubler, E. Müller, Paul, D.J.

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The cross-plane thermoelectric properties of p-Ge/Si0.5Ge0.5 superlattices von Ferre Llin, L., Samarelli, A., Cecchi, S., Etzelstorfer, T., Müller Gubler, E., Chrastina, D., Isella, G., Stangl, J., Weaver, J. M. R., Dobson, P. S., Paul, D. J.

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A simple method for high yield fabrication of sharp silicon tips von Burt, D.P., Dobson, P.S., Donaldson, L., Weaver, J.M.R.

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Improvements to the alignment process in a commercial vector scan electron beam lithography tool von Docherty, K.E., Thoms, S., Dobson, P., Weaver, J.M.R.

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Prospects for SiGe thermoelectric generators von Samarelli, A., Ferre Llin, L., Cecchi, S., Frigerio, J., Chrastina, D., Isella, G., Müller Gubler, E., Etzelstorfer, T., Stangl, J., Zhang, Y., Weaver, J.M.R., Dobson, P.S., Paul, D.J.

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Very high resolution etching of magnetic nanostructures in organic gases von Kong, X., Krása, D., Zhou, H.P., Williams, W., McVitie, S., Weaver, J.M.R., Wilkinson, C.D.W.

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Direct comparison of domain wall behavior in permalloy nanowires patterned by electron beam lithography and focused ion beam milling von Basith, M. A., McVitie, S., McGrouther, D., Chapman, J. N., Weaver, J. M. R.

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Direct observation of changes to domain wall structures in magnetic nanowires of varying width von O'Shea, K. J., McVitie, S., Chapman, J. N., Weaver, J. M. R.

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Batch fabricated dual cantilever resistive probe for scanning thermal microscopy von Zhang, Y., Dobson, P.S., Weaver, J.M.R.

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Growth and morphology control of carbon nanotubes at the apexes of pyramidal silicon tips von Edgeworth, J P, Burt, D P, Dobson, P S, Weaver, J M R, Macpherson, J V

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Batch fabrication of cantilever array aperture probes for scanning near-field optical microscopy von Zhang, Y., Docherty, K.E., Weaver, J.M.R.

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Nanometer-scale gaps between metallic electrodes fabricated using a statistical alignment technique von Steinmann, P., Weaver, J. M. R.

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Quantification of atomic force microscopy tip and sample thermal contact von Umatova, Zarina, Zhang, Y., Rajkumar, Ravishkrishnan, Dobson, Phillip S., Weaver, J. M. R.

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Scanning thermal microscopy on samples of varying effective thermal conductivities and identical flat surfaces von Guen, E., Chapuis, P.-O., Rajkumar, R., Dobson, P. S., Mills, G., Weaver, J. M. R., Gomés, S.

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Scanning thermal microscopy using batch fabricated thermocouple probes von Mills, G., Zhou, H., Midha, A., Donaldson, L., Weaver, J. M. R.

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