Risks of malignancies among patients with psoriasis: A cohort study of 360 patients von Watanabe, Tomoya, Watanabe, Yuko, Asai, Chika, Asami, Miho, Watanabe, Yukihiko, Saigusa, Yusuke, Yamaguchi, Yukie

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Efficacy and safety of apremilast and phototherapy versus phototherapy only in psoriasis vulgaris von Morita, Akimichi, Yamaguchi, Yukie, Tateishi, Chiharu, Ikumi, Kyoko, Yamamoto, Aya, Nishihara, Haruna, Hayashi, Daisuke, Watanabe, Yukihiko, Watanabe, Yuko, Maruyama, Ayano, Masuda, Koji, Tsuruta, Daisuke, Katoh, Norito

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Distinguishing nitrogen‐containing sites in SiO2/4H‐SiC(0001) after nitric oxide annealing by X‐ray absorption spectroscopy von Isomura, Noritake, Kutsuki, Katsuhiro, Kataoka, Keita, Watanabe, Yukihiko, Kimoto, Yasuji

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Relationship between threading dislocation and leakage current in 4H-SiC diodes von Fujiwara, Hirokazu, Naruoka, Hideki, Konishi, Masaki, Hamada, Kimimori, Katsuno, Takashi, Ishikawa, Tsuyoshi, Watanabe, Yukihiko, Endo, Takeshi

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Distinguishing nitrogen-containing sites in the m face of 4H-SiC after nitric oxide annealing by X-ray absorption spectroscopy von Isomura, Noritake, Kataoka, Keita, Watanabe, Yukihiko, Kimoto, Yasuji

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Impact of surface morphology above threading dislocations on leakage current in 4H-SiC diodes von Fujiwara, Hirokazu, Naruoka, Hideki, Konishi, Masaki, Hamada, Kimimori, Katsuno, Takashi, Ishikawa, Tsuyoshi, Watanabe, Yukihiko, Endo, Takeshi

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HIV‐associated psoriasis with fasciitis and arthritis successfully treated using antiretroviral therapy von Watanabe, Yukihiko, Yamaguchi, Yukie, Watanabe, Yuko, Asami, Miho, Takamura, Naoko, Watanabe, Tomoya, Kato, Hideaki, Aihara, Michiko

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X-ray absorption spectroscopy study on SiC-side interface structure of SiO2-SiC formed by thermal oxidation in dry oxygen von Isomura, Noritake, Kosaka, Satoru, Kataoka, Keita, Watanabe, Yukihiko, Kimoto, Yasuji

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An extraction method of channel resistance for analysis of carrier scattering mechanism in SiC trench MOSFETs von Kutsuki, Katsuhiro, Kagoshima, Eiji, Onishi, Toru, Saito, Jun, Yamamoto, Kensaku, Watanabe, Yukihiko

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Effect of surface roughness of trench sidewalls on electrical properties in 4H-SiC trench MOSFETs von Kutsuki, Katsuhiro, Murakami, Yuki, Watanabe, Yukihiko, Onishi, Toru, Yamamoto, Kensaku, Fujiwara, Hirokazu, Ito, Takahiro

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Analysis of surface morphology at leakage current sources of 4H-SiC Schottky barrier diodes von Katsuno, Takashi, Watanabe, Yukihiko, Fujiwara, Hirokazu, Konishi, Masaki, Naruoka, Hideki, Morimoto, Jun, Morino, Tomoo, Endo, Takeshi

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Impact of optical phonon scattering on inversion channel mobility in 4H-SiC trenched MOSFETs von Kutsuki, Katsuhiro, Kawaji, Sachiko, Watanabe, Yukihiko, Onishi, Toru, Fujiwara, Hirokazu, Yamamoto, Kensaku, Yamamoto, Toshimasa

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Theoretical analysis of short-circuit capability of SiC power MOSFETs von Shoji, Tomoyuki, Soeno, Akitaka, Toguchi, Hiroaki, Aoi, Sachiko, Watanabe, Yukihiko, Tadano, Hiroshi

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Chemical-state-selective X-ray absorption spectroscopy by detecting bond-specific Auger electrons for SiO2/SiC interface von Isomura, Noritake, Murai, Takaaki, Oji, Hiroshi, Nomoto, Toyokazu, Watanabe, Yukihiko, Kimoto, Yasuji

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Improved Evaluation Method for Channel Mobility in SiC Trench MOSFETs von Kawaji, Sachiko, Kutsuki, Katsuhiro, Watanabe, Yukihiko, Saito, Jun, Miyahara, Shinichiro

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Impact of Al Doping Concentration at Channel Region on Mobility and Threshold Voltage Instability in 4H-SiC Trench N-MOSFETs von Yamamoto, Kensaku, Kutsuki, Katsuhiro, Tsujimura, Masatoshi, Onishi, Toru, Kawaji, Sachiko, Watanabe, Yukihiko, Fujiwara, Hirokazu, Kanemura, Takashi

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Effects of Surface and Crystalline Defects on Reverse Characteristics of 4H-SiC Junction Barrier Schottky Diodes von Katsuno, Takashi, Watanabe, Yukihiko, Fujiwara, Hirokazu, Konishi, Masaki, Yamamoto, Takeo, Endo, Takeshi

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Electrical Properties of Metal--Insulator--Semiconductor Capacitors on Freestanding GaN Substrate von Kim, Eunhee, Soejima, Narumasa, Watanabe, Yukihiko, Ishiko, Masayasu, Kachi, Tetsu

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Surface Morphology of Leakage Current Sources of 4H-SiC Schottky Barrier Diodes by Atomic Force Microscope von Katsuno, Takashi, Ishikawa, Tsuyoshi, Endo, Takeshi, Fujiwara, Hirokazu, Konishi, Masaki, Morino, Tomoo, Watanabe, Yukihiko

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Specific receptors for adrenomedullin in cultured rat vascular smooth muscle cells von Eguchi, Satoru, Hirata, Yukio, Kano, Hiroaki, Sato, Kyoko, Watanabe, Yukihiko, Watanabe, Takushi X., Nakajima, Kiichiro, Sakakibara, Shumpei, Marumo, Fumiaki

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