Asymmetric Electrode Structure Induces Dual-Channel Phenomenon under Hot-Carrier Stress in Organic Thin-Film Transistors von Tu, Yu-Fa, Huang, Jen-Wei, Chang, Ting-Chang, Hung, Yang-Hao, Lu, I-Nien, Zhou, Kuan-Ju, Sun, Li-Chuan, Chen, Yu-An, Wu, Chia-Chuan, Hung, Wei-Chieh, Lee, Jason, Lien, Chen-Hsin

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Abnormal Degradation Behaviors Under Negative Bias Stress in Flexible p-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors After Laser Lift-Off Process von Wu, Chia-Chuan, Ma, William Cheng-Yu, Chang, Ting-Chang, Wang, Yu-Xuan, Tai, Mao-Chou, Tu, Yu-Fa, Chen, Yu-An, Tu, Hong-Yi, Chien, Ya-Ting, Chang, Han-Yu, Huang, Bo-Shen

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Analysis of Negative Bias Temperature Instability Degradation in p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors of Different Grain Sizes von Tu, Hong-Yi, Tsai, Tsung-Ming, Wu, Chia-Chuan, Tsao, Yu-Ching, Tai, Mao-Chou, Chang, Ting-Chang, Tsai, Yu-Lin, Huang, Shin-Ping, Zheng, Yu-Zhe, Wang, Yu-Xuan, Chen, Hong-Chih

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Abnormal Two-Stage Degradation on P-Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistor Under Hot Carrier Conditions von Tu, Hong-Yi, Chang, Ting-Chang, Tsao, Yu-Ching, Tai, Mao-Chou, Zheng, Yu-Zhe, Tu, Yu-Fa, Kuo, Chuan-Wei, Wu, Chia-Chuan, Tsai, Yu-Lin, Tsai, Tsung-Ming, Lin, Chih-Chih, Chien, Ya-Ting

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Effect of ELA Energy Density on Self-Heating Stress in Low-Temperature Polycrystalline Silicon Thin-Film Transistors von Huang, Shin-Ping, Chen, Hong-Chih, Chen, Po-Hsun, Zheng, Yu-Zhe, Chu, Ann-Kuo, Shih, Yu-Shan, Wang, Yu-Xuan, Wu, Chia-Chuan, Chen, Yu-An, Sun, Pei-Jun, Huang, Hui-Chun, Lai, Wei-Chih, Chang, Ting-Chang

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Suppression of Edge Effect Induced by Positive Gate Bias Stress in Low-Temperature Polycrystalline Silicon TFTs With Channel Width Extension Over Source/Drain Regions von Wang, Yu-Xuan, Tai, Mao-Chou, Chang, Ting-Chang, Huang, Shin-Ping, Zheng, Yu-Zhe, Wu, Chia-Chuan, Shih, Yu-Shan, Chen, Yu-An, Sun, Pei-Jun, Lu, I-Nien, Huang, Hui-Chun, Sze, Simon M.

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Analysis of Meridian Flow Direction by Electrical Stimulation Method von Liu, Yan-Wen, Kuo, Chuan-Wei, Chang, Ting-Chang, Hung, Yu-Chiang, Tan, Yung-Fang, Wu, Chia-Chuan, Lin, Chien-Hung, Chen, Wen-Chung, Hu, Wen-Long, Tsai, Tsung-Ming

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Improvement of Strained Negative Bias Temperature Instability in Flexible LTPS TFTs by a Stress-Release Design von Wang, Yu-Xuan, Chang, Ting-Chang, Tai, Mao-Chou, Wu, Chia-Chuan, Zheng, Yu-Zhe, Tu, Yu-Fa, Chen, Jian-Jie, Zhou, Kuan-Ju, Shih, Yu-Shan, Chen, Yu-An, Huang, Jen-Wei, Sze, Simon

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Enhancing Reliability and 2 mm-Axial Mechanical Bending Endurance by Gate Insulator Improvements in Flexible Polycrystalline Silicon TFTs von Zheng, Yu-Zhe, Chen, Po-Hsun, Chang, Ting-Chang, Tsai, Tsung-Ming, Zhou, Kuan-Ju, Tu, Yu-Fa, Wang, Yu-Xuan, Wu, Chia-Chuan, Chen, Yu-An, Sun, Pei-Jun, Chen, Juan-Jie, Tu, Hong-Yi, Hung, Yang-Hao, Lin, Yu-Shan, Ciou, Fong-Min, Shih, Yu-Shan, Huang, Hui-Chun

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Impact of AC Stress in Low Temperature Polycrystalline Silicon Thin Film Transistors Produced With Different Excimer Laser Annealing Energies von Zheng, Yu-Zhe, Wu, Chia-Chuan, Chen, Po-Hsun, Chang, Ting-Chang, Zhou, Kuan-Ju, Tu, Hong-Yi, Tu, Yu-Fa, Chen, Yu-An, Shih, Yu-Shan, Wang, Yu-Xuan, Sun, Pei-Jun, Hung, Yang-Hao, Tsai, Tsung-Ming

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Investigation of Degradation Behavior During Illuminated Negative Bias Temperature Stress in P-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors von Wang, Yu-Xuan, Chang, Ting-Chang, Tai, Mao-Chou, Wu, Chia-Chuan, Tu, Yu-Fa, Chen, Jian-Jie, Huang, Wei-Chen, Shih, Yu-Shan, Chen, Yu-An, Huang, Jen-Wei, Sze, Simon

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A Novel Structure to Reduce Degradation Under Mechanical Bending in Foldable Low Temperature Polysilicon TFTs Fabricated on Polyimide von Wang, Yu-Xuan, Chang, Ting-Chang, Huang, Shin-Ping, Tai, Mao-Chou, Zheng, Yu-Zhe, Wu, Chia-Chuan, Shih, Yu-Shan, Chen, Yu-An, Tsai, Yu-Lin, Tu, Hong-Yi, Lu, I-Nien, Zhou, Kuan-Ju, Lin, Chih-Chih, Chu, Ann-Kuo, Sze, Simon

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Enhancement of Mechanical Bending Stress Endurance Using an Organic Trench Structure in Foldable Polycrystalline Silicon TFTs von Zheng, Yu-Zhe, Huang, Shin-Ping, Chen, Po-Hsun, Chang, Ting-Chang, Tsai, Tsung-Ming, Chu, Ann-Kuo, Hung, Yang-Hao, Shih, Yu-Shan, Wang, Yu-Xuan, Wu, Chia-Chuan, Tu, Yu-Fa, Chen, Yu-An, Sun, Pei-Jun, Chung, Yu-Hua, Chen, Wei-Han, Wang, Tai-Jui

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Impact of Dehydrogenation Annealing Process Temperature on Reliability of Polycrystalline Silicon Thin Film Transistors von Huang, Shin-Ping, Chen, Po-Hsun, Chen, Hong-Chih, Zheng, Yu-Zhe, Chu, Ann-Kuo, Tsao, Yu-Ching, Shih, Yu-Shan, Wang, Yu-Xuan, Wu, Chia-Chuan, Lai, Wei-Chih, Chang, Ting-Chang

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An Expert Fitness Diagnosis System Based on Elastic Cloud Computing von Tseng, Kevin C., Wu, Chia-Chuan

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G-quadruplex formation by single-base mutation or deletion of mitochondrial DNA sequences von Chu, I-Te, Wu, Chia-Chuan, Chang, Ta-Chau

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Meridian study on the response current affected by acupuncture needling direction von Lin, Chien-Hung, Tan, Yung-Fang, Tseng, Shih-Ting, Chen, Wen-Chung, Kuo, Chuan-Wei, Wu, Chia-Chuan, Tsai, Tsung-Ming, Hu, Wen-Long, Chang, Ting-Chang, Hung, Yu-Chiang

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Protective effects of sesamin and sesamolin on murine BV-2 microglia cell line under hypoxia von Hou, Rolis Chien-Wei, Wu, Chia-Chuan, Yang, Chia-Hung, Jeng, Kee-Ching G

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Abnormal hysteresis formation in hump region after positive gate bias stress in low-temperature poly-silicon thin film transistors von Tu, Hong-Yi, Chang, Ting-Chang, Tsao, Yu-Ching, Tai, Mao-Chou, Tsai, Yu-Lin, Huang, Shin-Ping, Zheng, Yu-Zhe, Wang, Yu-Xuan, Lin, Chih-Chih, Kuo, Chuan-Wei, Tsai, Tsung-Ming, Wu, Chia-Chuan, Chien, Ya-Ting, Huang, Hui-Chun

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Augmentation of regulatory T cells in allergic individuals by recombinant Der f 2 peptide with fungal immunomodulatory peptide fve von Wu, Chia-Chuan, MS, Liao, En-Chih, MS, Lee, Mey-Fann, PhD, Tsai, Jaw-Ji, MD, PhD

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