Introduction and comparison of new EBSD post-processing methodologies von Wright, Stuart I., Nowell, Matthew M., Lindeman, Scott P., Camus, Patrick P., De Graef, Marc, Jackson, Michael A.

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NLPAR: Non-local smoothing for enhanced EBSD pattern indexing von Brewick, Patrick T., Wright, Stuart I., Rowenhorst, David J.

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Parent Grain Reconstruction in an Additive Manufactured Titanium Alloy von Wright, Stuart I., Lenthe, William C., Nowell, Matthew M.

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Determination of crystal phase from an electron backscatter diffraction pattern von Dingley, David J., Wright, Stuart I.

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Orientation effects on indexing of electron backscatter diffraction patterns von Nowell, Matthew M., Wright, Stuart I.

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In Situ EBSD Observations of the Evolution in Crystallographic Orientation with Deformation von Wright, Stuart I., Suzuki, Seiichi, Nowell, Matthew M.

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Electron imaging with an EBSD detector von Wright, Stuart I., Nowell, Matthew M., de Kloe, René, Camus, Patrick, Rampton, Travis

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Validation of kinematically simulated pattern HR-EBSD for measuring absolute strains and lattice tetragonality von Fullwood, David, Vaudin, Mark, Daniels, Craig, Ruggles, Timothy, Wright, Stuart I.

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Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns von Wright, Stuart I., Singh, Saransh, De Graef, Marc

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Characterization of order domains in [gamma]-TiAl by orientation microscopy based on electron backscatter diffraction von Zambaldi, Claudio, Zaefferer, Stefan, Wright, Stuart I

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Orientation Precision of Electron Backscatter Diffraction Measurements Near Grain Boundaries von Wright, Stuart I., Nowell, Matthew M., de Kloe, René, Chan, Lisa

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Optimizing Reflector Selection for Indexing of EBSD Patterns via Dynamic Pattern Simulation von Wright, Stuart I., De Graef, Marc, Singh, Saransh

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Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs) von Hansen, Landon T., Jackson, Brian E., Fullwood, David T., Wright, Stuart I., De Graef, Marc, Homer, Eric R., Wagoner, Robert H.

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Improved twin detection via tracking of individual Kikuchi band intensity of EBSD patterns von Rampton, Travis M., Wright, Stuart I., Miles, Michael P., Homer, Eric R., Wagoner, Robert H., Fullwood, David T.

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A comparison of textures measured using X-ray and electron backscatter diffraction von WRIGHT, Stuart I, NOWELL, Matthew M, BINGERT, John F

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Improved EBSD Map Fidelity through Re-indexing of Neighbor Averaged Patterns von Wright, Stuart I., Nowell, Matthew M., Lindeman, Scott P., Camus, Patrick

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Impact of Local Texture on Recrystallization and Grain Growth via In Situ EBSD von Field, David P., Nowell, Matthew M., Wright, Stuart I.

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A New Microstructural Imaging Approach through EBSD Pattern Region of Interest Analysis von Nowell, Matthew M., Wright, Stuart I., Rampton, Travis, de Kloe, René

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A Parametric Study of Electron Backscatter Diffraction based Grain Size Measurements von Wright, Stuart I.

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New Tools for the Study of Deformed and Heat-Treated Materials via Electron Backscatter Diffraction von Rampton, Travis M., Nowell, Matthew M., Wright, Stuart I.

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