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  1. 1
    Apparatus for measuring the amount of snow cover and snowfall using electrical conduction

    Apparatus for measuring the amount of snow cover and snowfall using electrical conduction von CHOI, JUNG-HAE, CHAE, BYUNG-GON, WON, YOUNGON

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  2. 2
    Apparatus for measuring the amount of snow cover and snowfall using electrical conduction

    Apparatus for measuring the amount of snow cover and snowfall using electrical conduction von CHOI, JUNG-HAE, CHAE, BYUNG-GON, WON, YOUNGON

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  3. 3
    Apparatus for measuring the amount of snow cover and snowfall using electrical conduction

    Apparatus for measuring the amount of snow cover and snowfall using electrical conduction von WON YOUNGON, CHAE BYUNG-GON, CHOI JUNG-HAE

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  4. 4
    APPARATUS FOR MEASURING THE AMOUNT OF SNOW COVER AND SNOWFALL USING ELECTRICAL CONDUCTION

    APPARATUS FOR MEASURING THE AMOUNT OF SNOW COVER AND SNOWFALL USING ELECTRICAL CONDUCTION von WON YOUNGON, CHAE BYUNG-GON, CHOI JUNG-HAE

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  5. 5
    Apparatus for measuring the amount of snow cover and snowfall using electrical conduction

    Apparatus for measuring the amount of snow cover and snowfall using electrical conduction von CHOI, JUNG-HAE, CHAE, BYUNG-GON, WON, YOUNGON

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  6. 6
    Methods of manufacturing a metal pattern of a semiconductor device which include forming nitride layer at exposed sidewalls of Ti layer of the pattern

    Methods of manufacturing a metal pattern of a semiconductor device which include forming nitride layer at exposed sidewalls of Ti layer of the pattern von KIM YOUNGON, PARK IN-SUN, KOO KYUNG-BUM, SONG WON-SANG

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  7. 7
    METHOD OF FORMING METAL PATTERN OF SEMICONDUCTOR DEVICE

    METHOD OF FORMING METAL PATTERN OF SEMICONDUCTOR DEVICE von GU KYOHAN, KIM YOUNGON, PARK IN-SUN, SONG WON-SANG

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  8. 8
    Method of manufacturing metal pattern of semiconductor device

    Method of manufacturing metal pattern of semiconductor device von KIM YOUNGON, PARK IN-SUN, KOO KYUNG-BUM, SONG WON-SANG

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