Can oxygen stabilize chromium nitride?—Characterization of high temperature cycled chromium oxynitride von Wilhartitz, Peter, Dreer, Sabine, Ramminger, Peter

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Electron-irradiation damage in chromium nitrides and chromium oxynitride thin films von Mitterbauer, Christoph, Grogger, Werner, Wilhartitz, Peter, Hofer, Ferdinand

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Statistical evaluation of refractive index, growth rate, hardness and Young's modulus of aluminium oxynitride films von Dreer, Sabine, Krismer, Robert, Wilhartitz, Peter, Friedbacher, Gernot

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Beschichtetes Werkzeug, Verfahren zu dessen Herstellung sowie Verwendung des Werkzeugs von Wilhartitz, Peter, Cremer, Rainer

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COATED TOOL, METHOD FOR THE PRODUCTION THEREOF AND USE OF THE TOOL von WILHARTITZ, Peter, CREMER, Rainer

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Accurate determination of trace amounts of oxygen in CrAlN hard coatings by a combination of WDS-EPMA and SIMS von DREER, Sabine, WILHARTITZ, Peter, SARTORY, Bernhard, TESSADRI, Richard, PIPLITS, Kurt, MAYERHOFER, Karl Emanuel

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Quantitative SIMS depth profiling of diffusion barrier gate-oxynitride structures in TFT-LCDs von Dreer, Sabine, Wilhartitz, Peter, Piplits, Kurt, Mayerhofer, Karl, Foisner, Johann, Hutter, Herbert

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Topochemical characterization of materials using 3D-SIMS von HUTTER, H, WILHARTITZ, P, GRASSERBAUER, M

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Optimisation of plasma techniques for trace analysis of refractory metals von WILHARTITZ, P

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Multidimensional optimisation of process parameters by experimental design for the deposition of aluminium and silicon oxynitride films with predictable composition von Dreer, Sabine, Krismer, Robert, Wilhartitz, Peter

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High performance ultra trace analysis in molybdenum and tungsten accomplished by on-line coupling of ion chromatography with simultaneous ICP-AES von WILHARTITZ, P, DREER, S, KRISMER, R, BOBLETER, O

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Can oxygen stabilize chromium nitride?: Characterization of high temperature cycled chromium oxynitride von WILHARTITZ, Peter, DREER, Sabine, RAMMINGER, Peter

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High performance analytical characterization of refractory metals von Ortner, Hugo M., Bl dorn, Wilhelm, Friedbacher, Gernot, Grasserbauer, Manfred, Krivan, Viliam, Virag, Alois, Wilhartitz, Peter, W nsch, Gerold

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Investigations on the Thermal Cycling Stability of SiFeCr Coated NbtZr von Gritsch, Martin, Piplits, Kurt, Barbist, Roland, Wilhartitz, Peter, Hutter, Herbert

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Quantitative analysis of silicon-oxynitride films by EPMA von DREER, S, WILHARTITZ, P, MERSDORF, E, FRIEDBACHER, G

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Quantitative analysis of thin aluminium-oxynitride films by EPMA von DREER, S, WILHARTITZ, P, MERSDORF, E, PIPLITS, K, FRIEDBACHER, G

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Investigations on the thermal cycling stability of SiFeCr coated NbWZr von GRITSCH, M, PIPLITS, K, BARBIST, R, WILHARTITZ, P, HUTTER, H

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The characterization of high-tech materials: Perspectives, challenges, trends von Ortner, Hugo M., Wilhartitz, Peter

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Quantitative sputter depth profiling of silicon- and aluminium oxynitride films von DREER, S, WILHARTITZ, P, PIPLITS, K, HUTTER, H, KOPNARSKI, M, FRIEDBACHER, G

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Investigation of the formation and properties of protective oxide layers on high purity chromium with SIMS imaging techniques von BRUNNER, C, HUTTER, H, WILHARTITZ, P, GRASSERBAUER, M

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