Characterization of crystal lattice defects in calcium molybdate single crystals (CaMoO4) by means of X-ray diffraction topography von Wierzbicka, E., Malinowska, A., Wieteska, K., Wierzchowski, W., Lefeld-Sosnowska, M., Świrkowicz, M., Łukasiewicz, T., Paulmann, C.

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Synchrotron topographic evaluation of strain around craters generated by irradiation with X-ray pulses from free electron laser with different intensities von Wierzchowski, W., Wieteska, K., Sobierajski, R., Klinger, D., Pełka, J., Żymierska, D., Paulmann, C., Hau-Riege, S.P., London, R.A., Graf, A., Burian, T., Chalupský, J., Gaudin, J., Krzywinski, J., Moeller, S., Messerschmidt, M., Bozek, J., Bostedt, Ch

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X-ray study of gadolinium gallium garnet epitaxial layers containing divalent Co ions von Mazur, K., Sarnecki, J., Borysiuk, J., Wierzchowski, W., Wieteska, K., Turos, A.

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High-resolution X-ray diffractometric, topographic and reflectometric studies of epitaxial layers on porous silicon destined for exfoliation von Mazur, K., Wieteska, K., Wierzchowski, W., Sarnecki, J., Lipiński, D., Brzozowski, A., Paulmann, C.

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Properties of Lu3Al5O12, Lu3Al5O12:Pr, Lu3Al5O12:Pr,Mo, and (Lu1−xYx)3Al5O12:Pr scintillator crystals von Talik, E, Kusz, J, Guzik, A, Szubka, M, Balin, K, Kisielewski, J, Wierzchowski, W, Malinowska, A, Strojny-Nedza, A, Pajaczkowska, A, Drozdowski, W

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"Ghost" segregation pattern and ferroelectric domains in mixed calcium-strontium-barium niobates von Wierzchowski, W., Wieteska, K., Malinowska, A., Wierzbicka, E., Romaniec, M., Lefeld-Sosnowska, M., Świrkowicz, M., Łukasiewicz, T., Sakowska, H., Paulmann, C.

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Ion implantation of the 4H SiC epitaxial layers and substrates with 2MeV Se+ and 1MeV Al+ ions von Wierzchowski, W, Turos, A, Wieteska, K, Stonert, A, Ratajczak, R, Jowik, P, Wilhelm, R, Akhamadaliev, S, Mazur, K, Paulmann, C

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The reduction of the misfit dislocation in non-doped AlAs/GaAs DBRs von Jasik, A., Wierzchowski, W., Muszalski, J., Gaca, J., Wójcik, M., Pierściński, K.

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Investigation of damage induced by intense femtosecond XUV pulses in silicon crystals by means of white beam synchrotron section topography von Wierzchowski, W., Wieteska, K., Klinger, D., Sobierajski, R., Pelka, J.B., Żymierska, D., Balcer, T., Chalupský, J., Gaudin, J., Hájková, V., Burian, T., Gleeson, A.J., Juha, L., Sinn, H., Sobota, D., Tiedtke, K., Toleikis, S., Tschentscher, T., Vyšín, L., Wabnitz, H., Paulmann, C.

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X-ray topography of Ca0.5Sr0.5NdAlO4 single crystal von MALINOWSKA, A, LEFELD-SOSNOWSKA, M, WIETESKA, K, WIERZCHOWSKI, W, GRAEFF, W, PAJACZKOWSKA, A

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Observation of individual dislocations in 6H and 4H SiC by means of back-reflection methods of X-ray diffraction topography von Wierzchowski, W., Wieteska, K., Balcer, T., Malinowska, A., Graeff, W., Hofman, W.

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X-ray topographic investigation of the deformation field around spots irradiated by FLASH single pulses von Wierzchowski, W., Wieteska, K., Balcer, T., Klinger, D., Sobierajski, R., Żymierska, D., Chalupský, J., Hájková, V., Burian, T., Gleeson, A.J., Juha, L., Tiedtke, K., Toleikis, S., Vyšín, L., Wabnitz, H., Gaudin, J.

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Revealing the defects in electron-irradiated Czochralski silicon von Misiuk, A., Bak-Misiuk, J., Jung, W., Felba, J., Wierzchowski, W., Wieteska, K., Prujszczyk, M.

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X-ray synchrotron diffraction studies of III-V semiconductor compounds implanted with hydrogen von Wieteska, K., Wierzchowski, W., Graeff, W., Gawlik, G.

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Investigation of structural perfection and faceting in highly Er-doped Yb3Al5O12 crystals von Kolodziejak, K., Wierzchowski, W., Wieteska, K., Malinowski, M., Graeff, W., Lukasiewicz, T.

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Effect of annealing under stress on defect structure of Si–Ge von Misiuk, A., Abrosimov, N.V., Romanowski, P., Bak-Misiuk, J., Wnuk, A., Surma, B., Wierzchowski, W., Wieteska, K., Graeff, W., Prujszczyk, M.

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Synchrotron white beam topography studies of SrLaGaO4 crystals von WIETESKA, K, WIERZCHOWSKI, W, GRAEFF, W, LEFELD-SOSNOWSKA, M, PAJACZKOWSKA, A, WIERZBICKA, E, MALINOWSKA, A

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Investigation of the defects distribution along the growth direction in GdCOB crystals by synchrotron and conventional X-ray topography von Wierzchowski, W., Wieteska, K., Graeff, W., Wierzbicka, E., Lefeld-Sosnowska, M., Kłos, A.

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Investigation of structural defects in ytterbium doped calcium gadolinum aluminate crystals by means of the synchrotron and conventional diffraction topography von Wierzbicka, E., Malinowska, A., Wierzchowski, W., Härtwig, J., Tran Thi, T.N., Kisielewski, J., Mazur, K.

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Numerical simulation of Bragg-case section topographic images of dislocations in silicon von Wierzchowski, W, Wieteska, K, Graeff, W

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