Reactive Species Generated during Wet Chemical Etching of Silicon in HF/HNO3 Mixtures von Steinert, Marco, Acker, Jörg, Krause, Matthias, Oswald, Steffen, Wetzig, Klaus

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Modification of carbon nanostructures by high energy ball-milling under argon and hydrogen atmosphere von Francke, Melanie, Hermann, Helmut, Wenzel, Roswitha, Seifert, Gotthard, Wetzig, Klaus

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Nanoscaled multilayers for magnetoelectronics – characterised by analytical TEM von Wetzig, Klaus, Thomas, Jürgen

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A theoretical approach to the interpretation of the transient data in scanning laser ablation inductively coupled plasma mass spectrometry: Consideration of the geometry of the sca... von Plotnikov, Alexei, Vogt, Carla, Wetzig, Klaus, Kyriakopoulos, Antonios

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Microstructure of Al/Ti metallization layers von Hofmann, Matthias, Gemming, Thomas, Menzel, Siegfried, Wetzig, Klaus

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Present possibilities of thin-layer analysis by GDOES von Hoffmann, Volker, Dorka, Roland, Wilken, Ludger, Hodoroaba, Vasile-Dan, Wetzig, Klaus

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An approach to the reconstruction of true concentration profile from transient signal in spatially resolved analysis by means of laser ablation ICP MS von Plotnikov, Alexei, Vogt, Carla, Wetzig, Klaus

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Correlation of Microstructure and Giant Magnetoresistance in Electrodeposited Ni – Cu/Cu Multilayers von Cziráki, Agnes, Gerőcs, Imre, Fogarassy, Bálint, Arnold, Birgit, Reibold, Marianne, Wetzig, Klaus, Tóth-Kádár, Enikõ, Bakonyi, Imre

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Depth profiling of electrically non-conductive layered samples by RF-GDOES and HFM plasma SNMS von Hodoroaba, Vasile-Dan, Unger, Wolfgang E.S, Jenett, Holger, Hoffmann, Volker, Hagenhoff, Birgit, Kayser, Sven, Wetzig, Klaus

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13th Applied Surface Analysis Workshop (AOFA 13) von Wetzig, Klaus

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Depth profile analysis of various titanium based coatings on steel and tungsten carbide using laser ablation inductively coupled plasma: time of flight mass spectrometry von BLEINER, Davide, PLOTNIKOV, Alexei, VOGT, Carla, WETZIG, Klaus, GÜNTHER, Detlef

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Analytical TEM for the investigation of thin functional layers von Wetzig, Klaus, Thomas, Jürgen, Bauer, Hans-Dietrich

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Comparison of depth resolution for direct current and radiofrequency modes in glow discharge optical emission spectrometry von PRÄSSLER, F, HOFFMANN, V, SCHUMANN, J, WETZIG, K

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Critical aspects on preparation of Bi-2223 glassy precursor by melt-process von Nilsson, Andreas, Gruner, Wolfgang, Acker, Jörg, Wetzig, Klaus

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DC- and RF-GD-OES measurements of adsorbed organic monolayers on copper von Klemm, Denis, Hoffmann, Volker, Wetzig, Klaus, Eckert, Jürgen

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DC- and RF-GD-OES measurements of adsorbed organic monolayers on copper: Analytical Science in Germany von KLEMM, Denis, HOFFMANN, Volker, WETZIG, Klaus, ECKERT, Jürgen

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Analysis of interface impurities in electroplated Cu layers by using GD-OES and TOF-SIMS von Klemm, Denis, Stangl, Marcel, Peeva, Anita, Hoffmann, Volker, Wetzig, Klaus, Eckert, Jürgen

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13th Applied Surface Analysis Workshop, Dresden, September 14th-17th 2004 (AOFA 13) von WETZIG, Klaus

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Non-destructive depth profile analysis using synchrotron radiation excited XPS von Zier, Michael, Oswald, Steffen, Reiche, Rainer, Wetzig, Klaus

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Nanostructured graphite prepared by ball-milling at low temperatures von Hentsche, Melanie, Hermann, Helmut, Gemming, Thomas, Wendrock, Horst, Wetzig, Klaus

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