Simulation of electron spectra for surface analysis (SESSA): a novel software tool for quantitative Auger-electron spectroscopy and X-ray photoelectron spectroscopy von Smekal, Werner, Werner, Wolfgang S. M., Powell, Cedric J.

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Surface excitations in electron spectroscopy. Part I: dielectric formalism and Monte Carlo algorithm von Salvat-Pujol, F., Werner, W. S. M.

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Electron transport in solids for quantitative surface analysis von Werner, Wolfgang S. M.

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Interpretation of nanoparticle X-ray photoelectron intensities von Werner, Wolfgang S. M., Chudzicki, Maksymillian, Smekal, Werner, Powell, Cedric J.

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Comparisons of Analytical Approaches for Determining Shell Thicknesses of Core–Shell Nanoparticles by X‑ray Photoelectron Spectroscopy von Powell, C. J, Werner, W. S. M, Kalbe, H, Shard, A. G, Castner, D. G

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Evaluating the Internal Structure of Core–Shell Nanoparticles Using X‑ray Photoelectron Intensities and Simulated Spectra von Chudzicki, M, Werner, W. S. M, Shard, A. G, Wang, Y.-C, Castner, D. G, Powell, C. J

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Secondary Electron Emission by Plasmon-Induced Symmetry Breaking in Highly Oriented Pyrolytic Graphite von Werner, Wolfgang S. M., Astašauskas, Vytautas, Ziegler, Philipp, Bellissimo, Alessandra, Stefani, Giovanni, Linhart, Lukas, Libisch, Florian

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Emission-depth-selective auger photoelectron coincidence spectroscopy von WERNER, Wolfgang S. M, SMEKAL, Werner, STÖRI, Herbert, WINTER, Hannspeter, STEFANI, Giovanni, RUOCCO, Alessandro, OFFI, Francesco, GOTTER, Roberto, MORGANTE, Alberto, TOMMASINI, Fernando

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Evaluation of Two Methods for Determining Shell Thicknesses of Core–Shell Nanoparticles by X‑ray Photoelectron Spectroscopy von Powell, C. J, Werner, W. S. M, Shard, A. G, Castner, D. G

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Optical Constants and Inelastic Electron-Scattering Data for 17 Elemental Metals von Werner, Wolfgang S. M., Glantschnig, Kathrin, Ambrosch-Draxl, Claudia

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Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer von Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Paták, Aleš, Müllerová, Ilona, Frank, Luděk, Piňos, Jakub, Průcha, Lukáš, Radlička, Tomáš, Werner, Wolfgang S M, Mikmeková, Eliška Materna

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Effective attenuation lengths for photoelectrons in thin films of silicon oxynitride and hafnium oxynitride on silicon von Powell, C. J., Werner, W. S. M., Smekal, W., Tasneem, G.

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Electron beams near surfaces: the concept of partial intensities for surface analysis and perspective on the low energy regime von Werner, Wolfgang S. M.

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Reflection electron energy loss spectrum of single layer graphene measured on a graphite substrate von Werner, Wolfgang S.M., Bellissimo, Alessandra, Leber, Roland, Ashraf, Afshan, Segui, Silvina

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Energy Dissipation of Fast Electrons in Polymethylmethacrylate: Toward a Universal Curve for Electron-Beam Attenuation in Solids between ∼0  eV and Relativistic Energies von Werner, Wolfgang S M, Simperl, Florian, Blödorn, Felix, Brunner, Julian, Kero, Johannes, Bellissimo, Alessandra, Ridzel, Olga

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Exploring the Dielectric Model in the Limit of Low‐Energy Electrons Interacting With Graphene von Segui, Silvina, Gervasoni, Juana, Arista, Néstor, Konvalina, Ivo, Werner, Wolfgang S. M.

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Effect of surface roughness on angle-resolved XPS von Katona, L., Bianchi, D., Brenner, J., Vorlaufer, G., Vernes, A., Betz, G., Werner, W. S. M.

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Analysis of reflection electron energy loss spectra (REELS) for determination of the dielectric function of solids: Fe, Co, Ni von Werner, Wolfgang S.M.

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Tribological properties of additives for water-based lubricants von Tomala, A., Karpinska, A., Werner, W.S.M., Olver, A., Störi, H.

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Effects of elastic scattering and analyzer-acceptance angle on the analysis of angle-resolved X-ray photoelectron spectroscopy data von Powell, C. J., Werner, W. S. M., Smekal, W.

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