Phase unwrapping in ICF target interferometric measurement via deep learning von Zhu, Shengtai, Zang, Zhongming, Wang, Xianmin, Wang, Yue, Wang, Xulongqi, Liu, Dong

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Wavelength optimization of fine optical surface defect detection based on FDTD von Wang, Shaowen, Wu, Lan, wang, Shiling, Liu, Dong, guo, Shiwei, Wang, Xulongqi, Jin, Bingwen, Deng, Zhiji, Cheng, Miao, Liu, Ming, Fu, Zhewei

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Chromatic aberration correction based on cross-channel information alignment in microscopy von Wang, Yue, Lei, Jiarui, Zheng, Jianfeng, Wang, Xulongqi, Cheng, Miao, Liu, Ming, Zhang, Junan, Chen, Weibin, Hu, Xiaoyao, Gu, Weizhong, Guo, Shiwei, Hu, Xiaobo, Gao, Zhigang, Liu, Dong

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Accuracy analysis of pseudo lateral shearing interferometry measuring complex spatio-temporal couplings von Peng, Shaojing, Xu, Zhaorui, Zang, Zhongming, Li, Xinming, Dai, Yaping, Wang, Xulongqi, Jin, Bingwen, Li, Xiangping, Sun, Jian, Yang, Bing, Cheng, Miao, Liu, Ming, Wang, Xiangzhao, Wu, Lan, Liu, Dong

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ZJU-Leaper: A Benchmark Dataset for Fabric Defect Detection and a Comparative Study von Zhang, Chenkai, Feng, Shaozhe, Wang, Xulongqi, Wang, Yueming

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Tuning color by pore depth of metal-coated porous alumina von Wang, Xulongqi, Zhang, Dongxian, Zhang, Haijun, Ma, Yi, Jiang, J Z

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A study of color modulation of porous alumina processed by physical vapor deposition von Wang, Xulongqi, Zhang, Dongxian, Zhang, Haijun

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Color tuning by local sputtering metal nanolayer on microstructured porous alumina von Wang, Xulongqi, Zhang, Haijun, Zhang, Dongxian, Ma, Yi, Fecht, H.-J., Jiang, J. Z.

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Tuning Color by Pore-Depth of Metal-Coated Nanostructured Porous Alumina von Zhang, Dongxian, Wang, Xulongqi, Zhang, Haijun, Ma, Yi

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An Effective Method for Extracting Capsule by Color Image Processing von Haifei Hou, Xulongqi Wang, Dongxian Zhang, Haijun Zhang

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Silicon wafer edge breakage defect visual detection device, method and system von WANG XULONGQI, FENG JIABIN, ZHAO RUI, KIM BYEONG-MOON, JIANG JIANFENG, YAN HAO, CHEN WANG

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Large-view-field high-resolution oblique projection lens and application von LIU DONG, WANG XULONGQI, KIM BYEONG-MOON, WANG SHILING, ZHENG JIANFENG

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Device and method for detecting photo-thermal characteristics of large-aperture optical element von LIU DONG, GUO SHIWEI, WANG XULONGQI, WANG SHAOWEN, KIM BYEONG-MOON, WANG SHILING, ZHANG FENGWEI

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Cup body welding seam positioning device based on machine vision, automatic system and method von WANG XULONGQI, KIM BYEONG-MOON, WU QUNCE, LU ZHE, ZHAO ZHINAN

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BGA chip positioning and detecting method based on dot matrix fitting von LIU DONG, WANG XULONGQI, KIM BYEONG-MOON, WANG ZHENGZHI, ZHENG JIANFENG

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Machine vision deep learning sample enhanced preview method, computer and storage medium von WANG XULONGQI, SHAO CHENZHE, KIM BYEONG-MOON, WANG PEIJUN, YOU LINYUAN

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Large-aperture planar optical element surface defect scanning method based on mechanical arm von LIU DONG, GUO SHIWEI, WANG XULONGQI, KIM BYEONG-MOON, WANG SHILING, LYU XIONGTAO, ZHANG FENGWEI

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Large-aperture spherical optical element centering and localization method under control of mechanical arm von LIU DONG, GUO SHIWEI, WANG XULONGQI, KIM BYEONG-MOON, WANG SHILING, LYU XIONGTAO, ZHANG FENGWEI

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Planar material surface defect detection device and detection modules thereof von WANG XULONGQI, BAI YUNFENG, CHEN LICHENG

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Method for measuring absolute liquid distance of silicon material in silicon single crystal rod straight pulling process von TIAN ZHIMIN, WANG XULONGQI, FAN LINFENG, KIM BYEONG-MOON, DENG ZOUCHAO

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