Impact of Miniature H-Field Probe on Measured Fields von Nesterova, Maryna, Wallash, Albert

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A Dynamic Scratch Test to Study Read/Write Head Degradation Due to Head-Disk Interactions von Wallash, A., Hong Zhu, Du Chen

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Electrostatic discharge and electrical breakdown study of the head-disk interface in a hard disk drive von Wallash, A.J.

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Degradation of GMR and TMR recording heads using very-short-duration ESD transients von Baril, L., Nichols, M., Wallash, A.

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New early failure phenomenon in electrostatic discharge damaged giant magnetoresistive recording heads von Wallash, Albert

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Standardized ESD test for magnetoresistive recording heads von Wallash, A.J.

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ESD SPICE model and measurements for a hard disk drive von Wallash, Al

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Electrostatic Discharge (ESD) Breakdown Between a Recording Head and a Disk With an Asperity von Wallash, A., Hong Zhu

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Analysis of RF Signal Interference Invasion Into Hard Disk Drive System and Coupled to Read Front-End System von Nishiyama, Nobumasa, Soga, Yuji, Contreras, John T., Wallash, Albert, Nakamura, Satoshi

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Magnetic changes in GMR heads caused by electrostatic discharge von Wallash, A., Kim, Y.K.

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A study of shunt ESD protection for GMR recording heads von Wallash, Al

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Analysis of Electrical Resonance of a Hard Disk Drives Suspension Interconnect and Invasion Into Read Signal Path von Nishiyama, Nobumasa, Soga, Yuji, Nagaoka, Kazuniro, Okada, Tomohisa, Contreras, John T., Wallash, Albert, Kuriyama, Akira

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Electrostatic modeling and ESD damage of magnetoresistive sensors von Wallash, A.J.

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Thermal stability testing of GMR recording heads von Wallash, A.J., Cheng, N.

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A study of voltage fluctuation, noise and magnetic instability in spin valve GMR recording heads von Wallash, A.

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The effects of EMI from cell phones on GMR magnetic recording heads and test equipment von Kraz, Vladimir, Wallash, Albert

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Effects of ESD transients on noise in tunneling recording heads von Baril, Lydia, Higgins, Bill, Wallash, Al

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Electrostatic discharge sensitivity of giant magnetoresistive recording heads von Wallash, Albert J., Kim, Young K.

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Effect of ESD transients on noise in GMR recording heads von Baril, Lydia, Wallash, Albert, Guarisco, Davide

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Direct charge device ESD test for magnetoresistive recording heads: study and standards von Baril, Lydia, Cheung, Tim, Wallash, Albert

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