A Physical-Model-Based Metal Charging Design Rule Methodology for Integrated Circuits von Lin, Wallace

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Physical-Model Guided Design on Transistor Test Structures for Extracting Metal Charging Design Rules von Lin, Wallace

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Bond-Pad Charging Protection Design for Charging-Free Reference Transistor Test Structures von Lin, Wallace

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Plasma Charging Behavior of p-MOSFETs With Floating Bond Pads and Its Application to Charging-Safe Bond Pad Design von Lin, Wallace

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Automated extraction of barrier heights for asymmetric MIM tunneling diodes von Lin, Wallace, Lu, Darsen D., Hong, Yi-Xiu, Hsu, Wei-Chou

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A New Technique for Measuring Gate-Oxide Leakage in Charging Protected MOSFETs von Lin, W.

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A multiple-terminal gate charging model von Lin, W.

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A New Gate-Charging Protection Strategy for Transistors in Integrated-Circuit Test Chips and Products von Lin, W., Smudski, J.

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Rough Notes for Mantos von WALLACE LIN

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A gate-charging model for ILD related plasma processes in MOSFETs von Lin, W., Sery, G.

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Multiple-terminal gate charging effect - competing/compensating charging behavior von Lin, W., Sery, G.

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Transistor plasma charging evaluator von Lin, Wallace W

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Method and apparatus for bond-pad charging protection of transistor test structures von Lin Wallace W

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Transistor plasma charging metal design rule generator von Lin Wallace W

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Transistor plasma charging eliminator von Lin Wallace W

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Method and apparatus for bond-pad charging protection of reference transistor test structures von Lin Wallace W

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Analytical Modelling of Ferroelectricity Instigated Enhanced Electrostatic Control in Short-Channel FinFETs von Ciou, Jhang-Yan, De, Sourav, Chien-Wei-Wang, Lin, Wallace, Lee, Yao-Jen, Lu, Darsen

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A model for n-well junction effect on gate-charging damage in PMOSFETs von Lin, W., Sery, G.

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Hydrogenation kinetics in oxidized boron-doped silicon irradiated by keV electrons von Lin, Wallace Wan-Li, Sah, Chih-Tang

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METHOD AND APPARATUS FOR BOND-PAD CHARGING PROTECTION OF TRANSISTOR TEST STRUCTURES von LIN WALLACE W

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